共 50 条
- [1] Characterization and Analysis of Bit Errors in 3D TLC NAND Flash Memory 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2019,
- [3] A Novel Data Recovery Technique for 3D TLC NAND Flash Memory Using Intercell Program 2023 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS, 2023,
- [4] Efficient Data Recovery Technique for 3D TLC NAND Flash Memory based on WL Interference 2021 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2021,
- [8] Read Retry Mechanism for 3D NAND Flash Memory: Observations, Analyses, and Solutions 2024 13TH NON-VOLATILE MEMORY SYSTEMS AND APPLICATIONS SYMPOSIUM, NVMSA 2024, 2024, : 49 - 54
- [10] Cross-temperature Reliabilities in TLC 3D NAND Flash Memory: Characterization and Solution 2023 7TH IEEE ELECTRON DEVICES TECHNOLOGY & MANUFACTURING CONFERENCE, EDTM, 2023,