Effect of annealing temperature on the structural and optical properties of vacuum evaporated Cu13Se52Bi35 thin films

被引：3

作者：

Alwany, A. B. ^{[1
]}

Alnakhlani, A. ^{[1
]}

Hassan, B. ^{[1
]}

Algradee, M. A. ^{[1
]}

Fouad, R. A. ^{[2
]}

Alfaqeer, A. A. ^{[3
]}

机构：

[1] Ibb Univ, Fac Sci, Phys Dept, Ibb, Yemen

[2] Qassim Univ, Coll Sci & Arts Muthnib, Dept Phys, Alasyah, Saudi Arabia

[3] Sheba Reg Univ, Fac Sci & Educ, Phys Dept, Marib, Yemen

来源：

CHALCOGENIDE LETTERS | 2024年 / 21卷 / 01期

关键词：

Cu13Se52Bi35 thin films; XRD; SEM; Morphology and optical properties; ELECTRICAL-PROPERTIES; ABSORPTION; CONSTANTS; GROWTH;

D O I：

10.15251/CL.2024.211.99

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Thermal evaporation technique was used to prepare Cu13Se52Bi35 thin films. The asdeposited and annealed samples were investigated by using the X-ray diffraction (XRD), scanning electron microscopy (SEM) and optical transmission and reflection. The XRD showed that the as-deposited film is crystalline in nature, and the crystalline size of samples increased with increasing the annealing temperature. SEM images showed that the morphology of the sample changes with the annealing temperature. The direct transition of the optical band gap (E-g) of Cu13Se52Bi35 films was observed and the values of E-g decreased with increasing the annealing temperature. Other optical parameters were also investigated.

引用

页码：99 / 112

页数：14

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