The dynamical behavior of the capacitively coupled Ar plasma driven by four frequencies (54, 80, 94 and 100MHz) at fixed pressure are simulated by the particle-in-cell/Monte-Carlo collisions (PIC/MCC) model based on the electromagnetic field. The magnetic field is generated by plasma current itself. The results show that the electron density, charge density, and electron temperature increase with the frequency increase when radio frequency (RF) power is 40W. The electron heating rate and argon ion heating rate near the sheath increase with the frequency increase. The high-energy electron density (>30 eV) varies nonlinearly with the frequency increase. The high-energy electron density is highest at 80MHz among the four frequencies. The electron density, charge density, and high-energy electron density increase with RF power (30, 45, 60, and 75W) increase at 80MHz. The electron temperature decreases with RF power increase at 80MHz. The electron heating rate and argon ion heating rate near the sheath have no change with RF power increase at 80MHz. The electron energy probability distributions (EEPF) show that the number of high-energy electrons (>30 eV) is highest at 80MHz. The reason may be the electron resonant heating that occurs in the plasma when the electron cyclotron frequency equals source frequency at 80MHz. The electron dynamics of capacitively coupled plasma is important for microelectronics etching and membrane deposition.
机构:
Donghua Univ, Coll Sci, Shanghai 201620, Peoples R ChinaDonghua Univ, Coll Sci, Shanghai 201620, Peoples R China
Xiao, Xijian
Wu, Jidun
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Donghua Univ, Coll Sci, Shanghai 201620, Peoples R ChinaDonghua Univ, Coll Sci, Shanghai 201620, Peoples R China
Wu, Jidun
Cao, Qilu
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Donghua Univ, Coll Sci, Shanghai 201620, Peoples R ChinaDonghua Univ, Coll Sci, Shanghai 201620, Peoples R China
Cao, Qilu
Huang, Xiaojiang
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Donghua Univ, Coll Sci, Shanghai 201620, Peoples R China
Minist Educ China, Magnet Confinement Fus Res Ctr, Shanghai 201620, Peoples R China
Text Key Lab Adv Plasma Technol & Applicat, Shanghai 201620, Peoples R ChinaDonghua Univ, Coll Sci, Shanghai 201620, Peoples R China
机构:
Purdue Univ, Sch Aeronaut & Astronaut, W Lafayette, IN 47907 USA
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USAPurdue Univ, Sch Aeronaut & Astronaut, W Lafayette, IN 47907 USA
Shivkumar, G.
Alrefae, M. A.
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Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USA
Purdue Univ, Sch Mech Engn, W Lafayette, IN 47907 USA
Royal Commiss Yanbu Coll & Inst, Yanbu Ind Coll, Yanbu, Saudi ArabiaPurdue Univ, Sch Aeronaut & Astronaut, W Lafayette, IN 47907 USA
Alrefae, M. A.
Tholeti, S. S.
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Purdue Univ, Sch Aeronaut & Astronaut, W Lafayette, IN 47907 USA
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USA
COMSOL Inc, Burlington, MA 01803 USAPurdue Univ, Sch Aeronaut & Astronaut, W Lafayette, IN 47907 USA
Tholeti, S. S.
Macheret, S. O.
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Purdue Univ, Sch Aeronaut & Astronaut, W Lafayette, IN 47907 USA
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USAPurdue Univ, Sch Aeronaut & Astronaut, W Lafayette, IN 47907 USA
Macheret, S. O.
Fisher, T. S.
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Univ Calif Los Angeles, Dept Mech & Aerosp Engn, Los Angeles, CA 90095 USAPurdue Univ, Sch Aeronaut & Astronaut, W Lafayette, IN 47907 USA
Fisher, T. S.
Alexeenko, A. A.
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Purdue Univ, Sch Aeronaut & Astronaut, W Lafayette, IN 47907 USA
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USAPurdue Univ, Sch Aeronaut & Astronaut, W Lafayette, IN 47907 USA
机构:
School of Physics and Optoelectronic Technology, Dalian University of TechnologySchool of Physics and Optoelectronic Technology, Dalian University of Technology
刘相梅
宋远红
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School of Physics and Optoelectronic Technology, Dalian University of TechnologySchool of Physics and Optoelectronic Technology, Dalian University of Technology
宋远红
王友年
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School of Physics and Optoelectronic Technology, Dalian University of TechnologySchool of Physics and Optoelectronic Technology, Dalian University of Technology