共 36 条
- [3] Asanovic K., 2016, UCB/EECS Tech. Rep.
- [4] Batude P, 2011, IEEE INT SYMP CIRC S, P2233
- [5] Bury E, 2018, PROC EUR S-STATE DEV, P186, DOI 10.1109/ESSDERC.2018.8486872
- [6] Compact modeling and SPICE-based simulation for electrothermal analysis of multilevel ULSI interconnects [J]. ICCAD 2001: IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER AIDED DESIGN, DIGEST OF TECHNICAL PAPERS, 2001, : 165 - 172
- [7] ASAP7: A 7-nm finFET predictive process design kit [J]. MICROELECTRONICS JOURNAL, 2016, 53 : 105 - 115
- [8] Coskun AK, 2009, DES AUT TEST EUROPE, P1410
- [9] Relative importance of grain boundaries and size effects in thermal conductivity of nanocrystalline materials [J]. SCIENTIFIC REPORTS, 2014, 4 : 7037