On Test Sets Concerning Local Stuck-at Faults of Fixed Multiplicity at the Inputs of Circuits

被引：0

|

作者：

Antyufeev, G. V. ^{[1
]}

Romanov, D. S. ^{[1
]}

机构：

[1] Lomonosov Moscow State Univ, Moscow 119992, Russia

来源：

MATHEMATICAL NOTES | 2023年 / 114卷 / 3-4期

关键词：

Boolean function; detection test set; diagnostic test set; Shannon function; stuck- at faults at the inputs of circuits;

D O I：

10.1134/S0001434623090109

中图分类号：

O1 [数学];

学科分类号：

0701 ; 070101 ;

摘要：

[No abstract available]

引用

收藏

页码：397 / 402

页数：6

相关论文

共 5 条

[1] On Test Sets Concerning Local Stuck-at Faults of Fixed Multiplicity at the Inputs of Circuits
G. V. Antyufeev
D. S. Romanov
Mathematical Notes, 2023, 114 : 397 - 402
[2] Tests with Stuck-At and Shift Faults on Circuit Inputs
Antyufeev G.V.
Romanov D.S.
Computational Mathematics and Modeling, 2020, 31 (4) : 494 - 500
[3] Fault detection tests for stuck-at faults on parity counter inputs
Romanov D.S.
Computational Mathematics and Modeling, 2015, 26 (3) : 429 - 435
[4] On Diagnostic Test Sets for Local Mirror Reflections on Circuit Inputs
Albek, M. K.
Romanov, D. S.
MATHEMATICAL NOTES, 2024, 115 (5-6) : 837 - 841
[5] Detecting tests for Boolean functions in presence of local linear faults of the inputs of circuits
Morozov E.V.
Romanov D.S.
Journal of Applied and Industrial Mathematics, 2015, 9 (2) : 263 - 270