Optimized and Automated Secure IC Design Flow: A Defense-in-Depth Approach

被引:3
作者
Gubbi, Kevin Immanuel [1 ]
Latibari, Banafsheh Saber [1 ]
Chowdhury, Muhtasim Alam [2 ]
Jalilzadeh, Afrooz [3 ]
Hamedani, Erfan Yazdandoost [3 ]
Rafatirad, Setareh [4 ]
Sasan, Avesta [1 ]
Homayoun, Houman [1 ]
Salehi, Soheil [2 ]
机构
[1] Univ Calif Davis, Dept Elect & Comp Engn, Davis, CA 95616 USA
[2] Univ Arizona, Dept Elect & Comp Engn, Tucson, AZ 85721 USA
[3] Univ Arizona, Dept Syst & Ind Engn, Tucson, AZ 85721 USA
[4] Univ Calif Davis, Dept Comp Sci, Davis, CA 95616 USA
关键词
Table lookup; Security; Hardware security; Integrated circuits; Electronics packaging; Logic gates; Reverse engineering; EDA; hardware security; power side-channel; reverse engineering; defense-in-depth; STT-MRAM; RECONFIGURABLE LOGIC; ARCHITECTURE; LOCKING;
D O I
10.1109/TCSI.2024.3364160
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The globalization of the manufacturing process and the supply chain for electronic hardware has been driven by the need to maximize profitability while lowering risk in a technologically advanced silicon sector. However, many hardware IPs' security features have been broken because of the rise in successful hardware attacks. Existing security efforts frequently ignore numerous dangers in favor of fixing a particular vulnerability. This inspired the development of a unique method that uses emerging spin-based devices to obfuscate circuitry to secure hardware intellectual property (IP) during fabrication and the supply chain. We propose an Optimized and Automated Secure IC (OASIC) Design Flow, a defense-in-depth approach that can minimize overhead while maximizing security. Our EDA tool flow uses a dynamic obfuscation method that employs dynamic lockboxes, which include switch boxes and magnetic random access memory (MRAM)-based look-up tables (LUT) while offering minimal overhead and being flexible and resilient against modern SAT-based attacks and power side-channel attacks. An EDA tool flow for optimized lockbox insertion is also developed to generate SAT-resilient design netlists with the least power and area overhead. PPA metrics and security (SAT attack time) are provided to the designer for each lockbox insertion run. A verification methodology is provided to verify locked and unlocked designs for functional correctness. Finally, we use ISCAS'85 benchmarks to show that the EDA tool flow provides a secure hardware netlist with maximum security while considering power and area constraints. Our results indicate that the proposed OASIC design flow can maximize security while incurring less than 15% area overhead and maintaining a similar power footprint compared to the original design. OASIC design flow demonstrates improved performance as design size increases, which demonstrates the scalability of the proposed approach.
引用
收藏
页码:2031 / 2044
页数:14
相关论文
共 66 条
  • [11] Di Natale G, 2019, DES AUT TEST EUROPE, P316, DOI [10.23919/date.2019.8714891, 10.23919/DATE.2019.8714891]
  • [12] Logic Locking: A Survey of Proposed Methods and Evaluation Metrics
    Dupuis, Sophie
    Flottes, Marie-Lise
    [J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2019, 35 (03): : 273 - 291
  • [13] Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model
    Dutertre, Jean-Max
    Beroulle, Vincent
    Candelier, Philippe
    De Castro, Stephan
    Faber, Louis-Barthelemy
    Flottes, Marie-Lise
    Gendrier, Philippe
    Hely, David
    Leveugle, Regis
    Maistri, Paolo
    Di Natale, Giorgio
    Papadimitriou, Athanasios
    Rouzeyre, Bruno
    [J]. 2018 WORKSHOP ON FAULT DIAGNOSIS AND TOLERANCE IN CRYPTOGRAPHY (FDTC), 2018, : 1 - 6
  • [14] Fadiheh MR, 2019, DES AUT TEST EUROPE, P994, DOI [10.23919/date.2019.8715004, 10.23919/DATE.2019.8715004]
  • [15] Fazekas K., 2020, THESIS JOHANNES KEPL
  • [16] Effective Robustness Analysis Using Bounded Model Checking Techniques
    Fey, Goerschwin
    Suelflow, Andre
    Frehse, Stefan
    Drechsler, Rolf
    [J]. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2011, 30 (08) : 1239 - 1252
  • [17] Fun-SAT: Functional Corruptibility-Guided SAT-Based Attack on Sequential Logic Encryption
    Hu, Yinghua
    Zhang, Yuke
    Yang, Kaixin
    Chen, Dake
    Beerel, Peter A.
    Nuzzo, Pierluigi
    [J]. 2021 IEEE INTERNATIONAL SYMPOSIUM ON HARDWARE ORIENTED SECURITY AND TRUST (HOST), 2021, : 281 - 291
  • [18] MIRID: Mixed-Mode IR-Drop Induced Delay Simulator
    Jiang, J.
    Aparicio, M.
    Comte, M.
    Azais, F.
    Renovell, M.
    Polian, I.
    [J]. 2013 22ND ASIAN TEST SYMPOSIUM (ATS), 2013, : 177 - 182
  • [19] Jin Hee Kim, 2015, 2015 25th International Conference on Field Programmable Logic and Applications (FPL), P1, DOI 10.1109/FPL.2015.7293955
  • [20] Jin Y, 2008, 2008 IEEE INTERNATIONAL WORKSHOP ON HARDWARE-ORIENTED SECURITY AND TRUST, P51, DOI 10.1109/HST.2008.4559049