Local structure and ordering of Al atoms in AlxGa1-xN epilayers

被引:1
|
作者
Spindlberger, Anna [1 ]
Ciatto, Gianluca [2 ]
Adhikari, Rajdeep [1 ,3 ]
Yadav, Ashok-Kumar [2 ]
Bonanni, Alberta [1 ]
机构
[1] Johannes Kepler Univ Linz, Inst Semicond & Solid State Phys, Altenberger Str 69, A-4040 Linz, Austria
[2] Synchrotron SOLEIL, BP 48, St Aubin, France
[3] Johannes Kepler Univ Linz, Linz Inst Technol, Altenberger Str 69, A-4040 Linz, Austria
基金
奥地利科学基金会; 瑞典研究理事会;
关键词
X-RAY-ABSORPTION; OPTICAL-PROPERTIES; FINE-STRUCTURE; THIN-FILMS; EMISSION; STATES; MN; 1ST-PRINCIPLES; SPECTROSCOPY; EVOLUTION;
D O I
10.1063/5.0167728
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this study, we investigate the local structure of aluminum (Al) in a comprehensive series of AlxGa1-xN epilayers, where the Al concentration spans from the dilute limit to 100%. We analyze grazing incidence Al K-edge tender x-ray absorption spectroscopy data using both linear combination fitting based on reference limit spectra and full quantitative analysis. The results indicate deviations from random cation distribution with varying signs within the explored concentration range. Additionally, we observe a reduction in cationic interatomic distances over a wide concentration range, which contrasts with some previous studies conducted at hard x-ray absorption edges.
引用
收藏
页数:6
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