Non-Destructive Imaging of Defects Using Non-Cooperative 5G Millimeter-Wave Signals

被引:5
|
作者
Vakalis, Stavros [1 ]
Colon-Berrios, Jorge R. [2 ]
Chen, Daniel [2 ]
Nanzer, Jeffrey A. [2 ]
机构
[1] Univ S Florida, Dept Elect Engn, Tampa, FL 33620 USA
[2] Michigan State Univ, Dept Elect & Comp Engn, E Lansing, MI 48824 USA
基金
美国国家科学基金会;
关键词
non-destructive testing; millimeter-wave imaging; 5G signals; joint sensing-communications; passive imaging;
D O I
10.3390/s23146421
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Recent developments in fifth-generation (5G) wireless communications networks are creating an increasingly crowded electromagnetic environment at microwave (3-30 GHz) and millimeter-wave (30-300 GHz) frequencies. Radiation at these bands can provide non-destructive testing of defects and shielded structures using non-ionizing signals. In an actual building setting where 5G millimeter-wave communications signals are present, passive imaging of the radiation that is propagating through a wall defect can take place by means of interferometric processing without emitting additional signals in an already-crowded spectrum. We investigate the use of millimeter-wave interferometric imaging of defects in building walls and shielded structures by capturing the transmission of 5G millimeter-wave signals through the defects. We experimentally explore the ability to image defects by capturing the transmission of 38 GHz signals through materials using a 24-element interferometric receiving array.
引用
收藏
页数:12
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