Detection of Defects on Cut-Out Switches in High-Resolution Images Based on YOLOv5 Algorithm

被引:0
作者
Kim, Young Jun [1 ]
Lim, Sung Soo [1 ]
Jeong, Se-Yeong [1 ]
Yoon, Ji Won [2 ]
机构
[1] KEPCO Res Inst, Digital Solut Lab, Daejeon 34056, South Korea
[2] Korea Univ, Inst Cyber Secur & Privacy ICSP, Seoul 02841, South Korea
关键词
Class-balanced loss; COS (Cut-out switch); Defect detection; Powerline equipment;
D O I
10.1007/s42835-024-01826-7
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The reliability of a cut-out switch (COS) directly affects the stable operation of electric power distribution systems. Detecting a defective COS plays a critical role in protecting the power distribution line transformer. Currently, the conditions of these devices are captured and monitored using high-resolution cameras, but the human visual interpretation is still required. This study presents a method of detecting four COS defects based on You Only Look Once (YOLO) v5. Its default feature network structure is modified to enhance high-resolution images' minimal feature extraction ability. We have improved the loss function to ensure challenging cases can draw more attention while training. The proposed approach based on YOLOv5 is reliable and accurate for defect detection in high-resolution and imbalanced data. The final COS defect-detection accuracy has been calculated as 81.1% mAP@.5, improving the baseline performance by 4.6%. The accuracy of crack and arc defects has been improved by 10.8% and 5.5%, respectively.
引用
收藏
页码:4537 / 4550
页数:14
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