A Novel Strategy for Detecting Permittivity and Loss Tangent of Low-Loss Materials Based on Cylindrical Resonant Cavity

被引：1

作者：

Zou, Jin ^{[1
,2
]}

Li, Chuan-Jian ^{[1
,2
]}

Zheng, Chen ^{[3
]}

Wang, Dong ^{[4
]}

Zhang, Jian ^{[3
]}

Wang, Xin ^{[5
]}

Zhang, Jun-Ying ^{[1
,2
]}

Hou, Zhi-Ling ^{[1
,2
]}

机构：

[1] Beijing Univ Chem Technol, Coll Math & Phys, Beijing 100029, Peoples R China

[2] Beijing Univ Chem Technol, Being Key Lab Environm Harmful Chem Anal, Beijing 100029, Peoples R China

[3] Aerosp Inst Adv Mat & Proc Technol, Beijing 100074, Peoples R China

[4] Second Mil Representat Off Air Force, Beijing 100074, Peoples R China

[5] Beijing Res Inst High Tech, Beijing 100094, Peoples R China

来源：

SENSORS | 2023年 / 23卷 / 12期

基金：

中国国家自然科学基金;

关键词：

low-loss materials; permittivity; loss tangent; cylindrical resonant cavity; DIELECTRIC-CONSTANT CHARACTERIZATION; FILM;

D O I：

10.3390/s23125469

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Accurate measurement of the permittivity and loss tangent of low-loss materials is essential due to their special applications in the field of ultra large scale integrated circuits and microwave devices. In this study, we developed a novel strategy that can accurately detect the permittivity and loss tangent of low-loss materials based on a cylindrical resonant cavity supporting the TE111 mode in X band (8-12 GHz). Based on an electromagnetic field simulation calculation of the cylindrical resonator, permittivity is precisely retrieved by exploring and analyzing the perturbation of the coupling hole and sample size on the cutoff wavenumber. A more precise approach to measuring the loss tangent of samples with various thicknesses has been proposed. The test results of the standard samples verify that this method can accurately measure the dielectric properties of samples that have smaller sizes than the high Q cylindrical cavity method.

引用

页数：14

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