Deep Learning-Based Material Characterization Using FMCW Radar With Open-Set Recognition Technique

被引:2
作者
Abouzaid, Salah [1 ]
Jaeschke, Timo [2 ]
Kueppers, Simon [2 ]
Barowski, Jan [3 ]
Pohl, Nils [1 ,4 ]
机构
[1] Ruhr Univ Bochum, Inst Integrated Syst, D-44801 Bochum, Germany
[2] 2pi LABS GmbH, Bochum, Germany
[3] Ruhr Univ Bochum, Inst Microwave Syst, D-44801 Bochum, Germany
[4] Fraunhofer Inst High Frequency Phys & Radar Tech F, D-53343 Wachtberg, Germany
关键词
Class anchor clustering (CAC); frequency-modulated continuous wave (FMCW) radar; K-means clustering; material characterization; material classification; open-set recog-nition (OSR); vector network analyzer (VNA); BAND;
D O I
10.1109/TMTT.2023.3276053
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This article proposes a low-cost and practical alter-native to vector network analyzers (VNAs) for characterizing dielectric materials using a calibrated frequency-modulated con-tinuous wave (FMCW) radar measurement setup and a machine learning (ML) model. The calibrated FMCW radar measurement setup has the ability to accurately measure the S-parameters of dielectric materials. In addition, an ML model is developed to extract material parameters such as thickness, dielectric constant, and loss tangent with high accuracy. K-means clustering was additionally applied to significantly reduce the complexity of the neural network (NN). Additionally, a state-of-the-art open -set recognition (OSR) technique was adopted to simultaneously classify known classes and reject unknown classes. The developed model uses a modified version of the class anchor clustering (CAC) distance-based loss, which outperforms the conventional cross-entropy loss. The proposed model was evaluated on several dielectric materials and compared to reference measurements using a VNA and curve fitting. The results indicate that the proposed model is accurate and robust, and that the calibrated radar sensor provides a practical and cost-effective alternative to VNAs in characterizing dielectric materials, as long as the material parameters are within the defined limits.
引用
收藏
页码:4628 / 4638
页数:11
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