In situ quantitative yttrium and trace elements imaging analysis of Y-doped BaF2 crystals by LA-ICP-MS

In this study, a laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) method for in-situ determination of yttrium and trace elements in yttrium-doped barium fluoride (BaF2: Y) crystals was proposed. A facile, micro-damage procedure for quantifying the segregation coefficient of doping elements was investigated, and it was found that the actual yttrium doping concentration increases from the seed end to the tail end in BaF2: Y crystals. In micro-area analysis, this method has higher mass sensitivity which was applied to quantify the impurity content and distribution during the growth of BaF2: Y crystals. Regression coefficient of calibration curve for each element ranged from 0.9918 to 0.9995. Detection limits (DLs) were 0.05, 0.03, 0.01 and 0.01 mu g g-1 for Mg, Zn, Sr and Pb, respectively. The accuracy of the proposed method was verified by inductively coupled plasma mass spectrometry/atomic emission spectroscopy (ICP-MS/AES) with wet-chemical pretreatment. The objective of the presented work was to provide a less damaging and more novelty approach for crystal sample analysis.