Product of Spacings Estimation in Step-Stress Accelerated Life Testing: An Alternative to Maximum Likelihood

被引:6
|
作者
Kateri, Maria [1 ]
Nikolov, Nikolay I. [1 ,2 ]
机构
[1] Rhein Westfal TH Aachen, Inst Stat, D-52056 Aachen, Germany
[2] Bulgarian Acad Sci, Inst Math & Informat, Sofia 1113, Bulgaria
关键词
Asymptotic equivalence; bootstrap confidence intervals; failure rate model; type-II censoring; Weibull lifetimes; FAILURE RATE MODEL; PARAMETERS; INFERENCE; DISTRIBUTIONS;
D O I
10.1109/TR.2024.3369977
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Accelerated life testing (ALT) experiments are widely used in reliability studies on extremely durable products having large mean times to failure. Simple step-stress ALT (SSALT) is a special class of ALT that tests the units under investigation on two different conditions by changing the stress factor (e.g., temperature, voltage, or pressure) at a predetermined time point of the experiment. In this study, we propose the maximum product of spacings (MPS) technique for estimating the unknown lifetime parameters as an alternative to the maximum likelihood (ML), which in some cases is not possible to be used. The MPS estimator is defined for a simple SSALT model under Type-II censoring and proved to be asymptotically equivalent to the corresponding ML estimator. The specific case of Weibull lifetimes sharing a common shape parameter on both stress levels under the tampered failure rate assumption is considered in more detail. Existence and uniqueness results are shown for the point estimators of both methods and an adjusted bootstrap algorithm is suggested for constructing interval inference procedures. Further, the ML and MPS approaches are compared via a simulation study and applied to two real lifetime data examples.
引用
收藏
页码:1433 / 1445
页数:13
相关论文
共 50 条
  • [41] Step-stress Accelerated Degradation Testing of NBR Sealing Ring
    Wang, Xiaohong
    Wang, Lizhi
    Zhang, Xin
    Li, Qiuxi
    APPLIED SCIENCE AND PRECISION ENGINEERING INNOVATION, PTS 1 AND 2, 2014, 479-480 : 55 - 59
  • [42] Improved step stress accelerated life testing method for electronic product
    He Qingchuan
    Chen Wenhua
    Pan Jun
    Qian Ping
    MICROELECTRONICS RELIABILITY, 2012, 52 (11) : 2773 - 2780
  • [43] OPTIMUM SIMPLE STEP-STRESS ACCELERATED LIFE TESTS WITH CENSORING
    BAI, DS
    KIM, MS
    LEE, SH
    IEEE TRANSACTIONS ON RELIABILITY, 1989, 38 (05) : 528 - 532
  • [44] Bayesian analysis for step-stress accelerated life testing using weibull proportional hazard model
    Sha, Naijun
    Pan, Rong
    STATISTICAL PAPERS, 2014, 55 (03) : 715 - 726
  • [45] Bayesian Planning of Optimal Step-Stress Accelerated Life Test
    Yuan, Tao
    Liu, Xi
    ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM (RAMS), 2011 PROCEEDINGS, 2011,
  • [46] Competing Risks in Accelerated Life Testing: A Study on Step-Stress Models with Tampered Random Variables
    Ahmad, Hanan Haj
    Almetwally, Ehab M.
    Ramadan, Dina A.
    AXIOMS, 2025, 14 (01)
  • [47] Bayesian Inference Model for Step-Stress Accelerated Life Testing with Type-II Censoring
    Lee, Jinsuk
    Pan, Rong
    ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM, 2008 PROCEEDINGS, 2008, : 93 - 98
  • [48] ESTIMATION OF PARAMETERS IN STEP-STRESS ACCELERATED LIFE TESTS FOR THE RAYLEIGH DISTRIBUTION UNDER CENSORING SETUP
    Chandra, N.
    Khan, Mashroor Ahmad
    JOURNAL OF RELIABILITY AND STATISTICAL STUDIES, 2014, 7 (02): : 1 - 18
  • [49] Bayesian analysis for step-stress accelerated life testing using weibull proportional hazard model
    Naijun Sha
    Rong Pan
    Statistical Papers, 2014, 55 : 715 - 726
  • [50] Simple Heterogeneous Step-Stress Accelerated Life Testing Model Under Type II Censoring
    Lu, Yao
    Kateri, Maria
    QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, 2025,