A field programmable gate array based Langmuir probe system for measurement of plasma parameters at 500 kHz in a high-power impulse magnetron sputtering plasma

被引:0
作者
Hickling, C. J. [1 ,2 ]
Hall, S. [2 ]
Harrison, J. R. [2 ]
Sharples, R. [3 ]
Bradley, J. W. [1 ]
机构
[1] Univ Liverpool, Dept Elect Engn & Elect, Brownlow Hill, Liverpool L69 3GJ, England
[2] Culham Sci Ctr, UK Atom Energy Author, Abingdon OX14 3DB, Oxfordshire, England
[3] Univ Durham, Dept Phys, Lower Mountjoy,South Rd, Durham DH1 3LE, England
基金
英国工程与自然科学研究理事会;
关键词
Electron temperature - Field programmable gate arrays (FPGA) - Logic gates - Magnetron sputtering;
D O I
10.1063/5.0174458
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
By utilizing Field Programmable Gate Arrays in a configuration similar to that of the Mirror Langmuir Probe, it is possible to bias a single probe at three precise voltages in sequence. These voltages can be dynamically adjusted in real-time based on the measured plasma electron temperature to ensure the transition region is always sampled. The first results have been obtained by employing this method and have generated real-time outputs of electron temperature, ion saturation current, and floating potential on a low temperature pulsed-DC magnetron at 500 kHz. These results are in good agreement with the analysis of a conventionally swept Langmuir probe. This probe is designed with the intention of being implemented on MAST-U to aid in the study of exhaust physics and enable further investigation into filamentary behavior.
引用
收藏
页数:7
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