Maximum-likelihood estimation in ptychography in the presence of Poisson-Gaussian noise statistics publisher's note (vol 48, 6027, 2023)

被引:0
|
作者
Seifert, Jacob [1 ,2 ]
Shao, Yifeng [1 ,2 ,3 ]
Van Dam, Rens [1 ,2 ]
Bouchet, Dorian [4 ]
Van Leeuwen, Tristan [5 ,6 ]
Mosk, Allard p. [1 ,2 ]
机构
[1] Univ Utrecht, Nanophoton, Debye Inst Nanomat Sci, POB 80000, NL-3508 TA Utrecht, Netherlands
[2] Univ Utrecht, Ctr Extreme Matter & Emergent Phenomena, POB 80000, NL-3508 TA Utrecht, Netherlands
[3] Delft Univ Technol, Appl Sci Fac, Imaging Phys Dept, Delft, Netherlands
[4] Univ Grenoble Alpes, LIPhy, CNRS, F-38000 Grenoble, France
[5] Ctr Wiskunde Informat, Sci Pk 123, NL-1098 XG Amsterdam, Netherlands
[6] Univ Utrecht, Math Inst, Budapestlaan 6, NL-3584 CD Utrecht, Netherlands
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中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
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页码:6291 / 6291
页数:1
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