Improving 3-D NAND SSD Read Performance by Parallelizing Read-Retry

被引:6
|
作者
Cui, Jinhua [1 ]
Zeng, Zhimin [1 ]
Huang, Jianhang [2 ]
Yuan, Weiqi [1 ]
Yang, Laurence T. [1 ,3 ]
机构
[1] Huazhong Univ Sci & Technol, Sch Comp Sci & Technol, Wuhan 430074, Hubei, Peoples R China
[2] Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Xian 710049, Shaanxi, Peoples R China
[3] St Francis Xavier Univ, Dept Comp Sci, Antigonish, NS B2G 2W5, Canada
基金
中国国家自然科学基金;
关键词
Ash; Three-dimensional displays; Error correction codes; Reliability; Threshold voltage; Parallel processing; Decoding; Flash memory; parallel; process similarity (PS); process variation (PV); read-retry; LIFETIME IMPROVEMENT; FLASH; RETENTION; OPTIMIZATION; REFRESH;
D O I
10.1109/TCAD.2022.3191256
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
With the bit density improvement and the 3-D flash techniques, modern NAND flash-memory-based solid-state disks (SSDs) dramatically increase the flash storage capacity. However, in high-density SSDs, the long read latency overheads due to massive read-retry steps have become a serious performance concern to develop flash memory in storage devices. In this article, we proposed a parallel read-retry scheme (PaRR) to utilize the read-retry characteristics among flash memory cells. Specifically, when reading the multiple data pages simultaneously, PaRR reduces the read-response time by parallelizing read-retry operations. PaRR reduces the number of read-retry operations by parallelizing read-retry steps with the different aggressive read reference voltages if simultaneously reading the data pages that exhibit virtually equivalent reliability characteristic. Our evaluation shows that PaRR improves the I/O performance by 33.77% on average compared with the state-of-the-art scheme.
引用
收藏
页码:768 / 780
页数:13
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