Expanding accessible 3D sample size in lab-based X-ray nanotomography without compromising resolution

被引:2
作者
Englisch, Silvan
Wirth, Janis
Drobek, Dominik
Zubiri, Benjamin Apeleo [1 ]
Spiecker, Erdmann [1 ]
机构
[1] Friedrich Alexander Univ Erlangen Nurnberg, Interdisciplinary Ctr Nanostruct Films IZNF, Inst Microand Nanostruct Res IMN, Erlangen, Germany
来源
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY | 2023年 / 82卷
关键词
Multiple field-of-view tomography; Stitching tomography; Extended field of view; X-ray nanotomography; Lab-based nano-CT; Porous and low-Z materials; X-ray microscope performance; Resolution determination; Crowther criterion; Fourier shell correlation; ELECTRON TOMOGRAPHY; RECONSTRUCTION; MICROSCOPE; PLATFORM; OBJECTS;
D O I
10.1016/j.precisioneng.2023.02.011
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
State-of-the-art lab-based X-ray nanotomography enables versatile and well-accessible three-dimensional imaging of samples with spatial resolutions comparable to synchrotron setups. By its nature, the technique brings a trade-off between high spatial resolution and accessible sample volume. A so-called 'stitching approach' can overcome this challenge by extending the accessible three-dimensional volume without compromising spatial resolution and is demonstrated in a state-of-the-art lab-based X-ray microscope on two porous, low-Z material systems: macroporous zeolite particles and supported catalytically active metal solutions. Fourier ring and shell correlation are utilized to calculate the achievable two-and three-dimensional resolution of the X-ray microscope and the tomographic reconstructions, respectively. The excellent performance of the stitching approach is evaluated by comparing three-dimensional reconstructions of identical sample volumes obtained with and without stitching at different magnifications. The influence of illumination time, depth of field and number of projections are investigated by comparing the spatial resolution of the experiments with theoretical resolution limits.
引用
收藏
页码:169 / 183
页数:15
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