Complementary Resistive Switching in ZnO/Al2O3 Bi-Layer Devices

被引:2
作者
Lekshmi, Jagath Arya [1 ]
Kumar, T. Nandha [1 ]
Jinesh, K. B. [2 ]
机构
[1] Univ Nottingham Malaysia, Dept Elect & Elect Engn, Semenyih 43500, Malaysia
[2] Indian Inst Space Sci & Technol, Dept Phys, Thiruvananthapuram 695547, India
关键词
Complementary resistive switching; nonvolatile memory; power; resistive random-access memory; sneak path current; ZnO; BIPOLAR; BEHAVIOR;
D O I
10.1109/TNANO.2023.3268204
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper reports the complementary resistive switching (CRS) characteristics exhibited by Au/ZnO/Al2O3/Fluorine doped tin oxide (FTO) bilayer device for the first time, where both ZnO and Al2O3 are active switching layers exhibiting resistive switching properties. The I-V characteristics of the device initially show bipolar resistive switching (BRS) for a few cycles (similar to 12) before permanently switching to CRS with the extension of SET voltage. The stable CRS state of the device exhibits a high current of similar to 500 mu A during the ON-state and low current of 3 x 10(-7) A during OFF-state at low input voltages (-0.5 V to 0.5 V) enables the proposed device suitable to use in crossbar array to mitigate the sneak path current. The device performance to write and read processes is evaluated with pulses of magnitudes similar to|2.5| V and 1.3 V, respectively, and showed a similar to 60 mu A difference in read-out current between data bits 0 and 1. Similarly, the device's power consumption is also measured to elucidate that the device is suitable to use as a memory unit with power consumption in the order of microwatts (mu W). Further, the possible switching mechanism is demonstrated based on oxygen vacancies migration.
引用
收藏
页码:206 / 213
页数:8
相关论文
共 41 条
  • [1] Adeyemo A, 2014, INT WORKS POW TIM
  • [2] Multiple Memory States in Resistive Switching Devices Through Controlled Size and Orientation of the Conductive Filament
    Balatti, S.
    Larentis, S.
    Gilmer, D. C.
    Ielmini, D.
    [J]. ADVANCED MATERIALS, 2013, 25 (10) : 1474 - 1478
  • [3] Low-current operations in 4F2-compatible Ta2O5-based complementary resistive switches
    Breuer, Thomas
    Siemon, Anne
    Linn, Eike
    Menzel, Stephan
    Waser, Rainer
    Rana, Vikas
    [J]. NANOTECHNOLOGY, 2015, 26 (41)
  • [4] Chen B, 2011, 2011 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)
  • [5] Switching Kinetic of VCM-Based Memristor: Evolution and Positioning of Nanofilament
    Chen, Jui-Yuan
    Huang, Chun-Wei
    Chiu, Chung-Hua
    Huang, Yu-Ting
    Wu, Wen-Wei
    [J]. ADVANCED MATERIALS, 2015, 27 (34) : 5028 - +
  • [6] Complementary resistive switching behaviors evolved from bipolar TiN/HfO2/Pt device
    Chen, Xinman
    Hu, Wei
    Li, Yan
    Wu, Shuxiang
    Bao, Dinghua
    [J]. APPLIED PHYSICS LETTERS, 2016, 108 (05)
  • [7] Complementary switching on TiN/MgZnO/ZnO/Pt bipolar memory devices for nanocrossbar arrays
    Chen, Xinman
    Hu, Wei
    Wu, Shuxiang
    Bao, Dinghua
    [J]. JOURNAL OF ALLOYS AND COMPOUNDS, 2014, 615 : 566 - 568
  • [8] Tri-Level Resistive Switching in Metal-Nanocrystal-Based Al2O3/SiO2 Gate Stack
    Chen, Y. N.
    Pey, K. L.
    Goh, K. E. J.
    Lwin, Z. Z.
    Singh, P. K.
    Mahapatra, S.
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2010, 57 (11) : 3001 - 3005
  • [9] Complementary Resistive Switching in Flexible RRAM Devices
    Dai, Ya-Wei
    Chen, Lin
    Yang, Wen
    Sun, Qing-Qing
    Zhou, Peng
    Wang, Peng-Fei
    Ding, Shi-Jin
    Zhang, David Wei
    Xiao, Fei
    [J]. IEEE ELECTRON DEVICE LETTERS, 2014, 35 (09) : 915 - 917
  • [10] Recent Progress in Selector and Self-Rectifying Devices for Resistive Random-Access Memory Application
    Dongale, Tukaram D.
    Kamble, Girish U.
    Kang, Dae Yun
    Kundale, Somnath S.
    An, Ho-Myoung
    Kim, Tae Geun
    [J]. PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2021, 15 (09):