Exploration of Ultrasonic Guided wave Resonance Technique for Damage Localization

被引:0
|
作者
Gain, Supriya [1 ]
Basu, Subhadeep [1 ]
Sinharay, Arijit [1 ]
机构
[1] TCS Res, Kolkata, India
来源
2023 IEEE SENSORS | 2023年
关键词
Guided wave; resonance spectra; Lamb wave; unobtrusive sensing; Swept frequency measurements;
D O I
10.1109/SENSORS56945.2023.10325301
中图分类号
R318 [生物医学工程];
学科分类号
0831 ;
摘要
This paper explores a novel Guided wave resonance-based technique for damage localization in metal sheets. Ultrasonic Guided waves for damage identification and localization is a well matured technique in Non-Destructive Testing /Evaluation. However, most of the time it is performed with high voltage pulse excitations that use several hundreds of volts in the form of a short burst. Here, we used a very low voltage excitation (5Vpp) and continuous waves to do the same job with very promising results. The key to the technique lies in taking advantage of Guided wave resonance conditions to boost up the Signal to Noise ratio by several order higher.
引用
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页数:4
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