Unveiling Corrosion Pathways of Sn Nanocrystals through High-Resolution Liquid Cell Electron Microscopy

被引:5
|
作者
Peng, Xinxing [1 ]
Shangguan, Junyi [1 ,2 ]
Zhang, Qiubo [1 ]
Hauwiller, Matthew [1 ,3 ]
Yu, Haobo [4 ]
Nie, Yifan [1 ]
Bustillo, Karen C. [5 ]
Alivisatos, A. Paul [1 ,2 ,3 ,6 ]
Asta, Mark [1 ,2 ]
Zheng, Haimei [1 ,2 ]
机构
[1] Lawrence Berkeley Natl Lab, Mat Sci Div, Berkeley, CA 94720 USA
[2] Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA
[3] Univ Calif Berkeley, Dept Chem, Berkeley, CA 94720 USA
[4] China Univ Petr, Coll New Energy & Mat, Beijing Key Lab Failure, Corros & Protect Oil Gas Facil Mat, Beijing 102249, Peoples R China
[5] Natl Ctr Electron Microscopy, Lawrence Berkeley Natl Lab, Mol Foundry, Berkeley, CA 94720 USA
[6] Univ Calif, Kavli Energy Nanosci Inst, Lawrence Berkeley Natl Lab, Berkeley, CA 94720 USA
关键词
liquid cell TEM; Sn nanocrystal; pitting corrosion; uniformcorrosion; IN-SITU; CHALLENGES;
D O I
10.1021/acs.nanolett.3c03913
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Unveiling materials' corrosion pathways is significant for understanding the corrosion mechanisms and designing corrosion-resistant materials. Here, we investigate the corrosion behavior of Sn@Ni3Sn4 and Sn nanocrystals in an aqueous solution in real time by using high-resolution liquid cell transmission electron microscopy. Our direct observation reveals an unprecedented level of detail on the corrosion of Sn metal with/without a coating of Ni3Sn4 at the nanometric and atomic levels. The Sn@Ni3Sn4 nanocrystals exhibit "pitting corrosion", which is initiated at the defect sites in the Ni3Sn4 protective layer. The early stage isotropic etching transforms into facet-dependent etching, resulting in a cavity terminated with low-index facets. The Sn nanocrystals under fast etching kinetics show uniform corrosion, and smooth surfaces are obtained. Sn nanocrystals show "creeping-like" etching behavior and rough surfaces. This study provides critical insights into the impacts of coating, defects, and ion diffusion on corrosion kinetics and the resulting morphologies.
引用
收藏
页码:1168 / 1175
页数:8
相关论文
共 50 条
  • [21] High-Resolution Electron Microscopy of Quasicrystals
    Hiraga, Kenji
    Microscopy, 1991, 40 (02) : 81 - 91
  • [22] High-resolution electron microscopy of quasicrystals
    Beeli, C
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2000, 294 : 23 - 28
  • [23] High-resolution analytical electron microscopy characterization of corrosion and cracking at buried interfaces
    Bruemmer, SM
    Thomas, LE
    SURFACE AND INTERFACE ANALYSIS, 2001, 31 (07) : 571 - 581
  • [24] Amorphous-Phase-Mediated Crystallization of Ni Nanocrystals Revealed by High-Resolution Liquid-Phase Electron Microscopy
    Yang, Jiwoong
    Koo, Jahyun
    Kim, Seulwoo
    Jeon, Sungho
    Choi, Back Kyu
    Kwon, Sangwoo
    Kim, Joodeok
    Kim, Byung Hyo
    Lee, Won Chul
    Lee, Won Bo
    Lee, Hoonkyung
    Hyeon, Taeghwan
    Ercius, Peter
    Park, Jungwon
    JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2019, 141 (02) : 763 - 768
  • [25] Unraveling the Growth Mechanism of Chiral Inorganic Nanocrystals via High-Resolution Electron Microscopy
    Chu, Chaoyang
    Wang, Yao
    Ma, Yanhang
    Journal of the American Chemical Society, 2024, 146 (51) : 35339 - 35346
  • [26] Electron microscopy: Cutting the cost of high-resolution microscopy
    Koster, AJ
    Zandbergen, H
    NATURE MATERIALS, 2005, 4 (12) : 885 - 886
  • [27] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF RAPIDLY QUENCHED AL-SN ALLOY
    ICHINOSE, H
    ISHIDA, Y
    SCRIPTA METALLURGICA, 1985, 19 (01): : 5 - 9
  • [28] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF NB3SN AND ITS DEFECTS
    KITANO, Y
    NISSEN, HU
    KWASNITZA, K
    CRYOGENICS, 1982, 22 (12) : 635 - 638
  • [29] HIGH-RESOLUTION CELL ARCHITECTURE BY HIGH-VOLTAGE ELECTRON-MICROSCOPY
    FOTINO, M
    BIOPHYSICAL JOURNAL, 1978, 21 (03) : A157 - A157
  • [30] HIGH-RESOLUTION CELL ARCHITECTURE BY HIGH-VOLTAGE ELECTRON-MICROSCOPY
    FOTINO, M
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (03): : 352 - 352