HAXPES Cr Kα measurement of bulk indium

被引：2

作者：

Zborowski, C. ^{[1
,2
]}

Vanleenhove, A. ^{[1
]}

Hoflijk, I. ^{[1
]}

Vaesen, I. ^{[1
]}

Artyushkova, K. ^{[3
]}

Conard, T. ^{[1
]}

机构：

[1] Imec, MCACSA, Kapeldreef 75, B-3001 Leuven, Belgium

[2] Katholieke Univ Leuven, Inst Kern En Stralingsfys, Celestijnenlaan 200D, B-3001 Leuven, Belgium

[3] Phys Elect, 18725 Lake Dr East, Chanhassen, MN USA

来源：

SURFACE SCIENCE SPECTRA | 2023年 / 30卷 / 02期

关键词：

Indium; HAXPES; Cr K-alpha;

D O I：

10.1116/6.0003161

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Indium was analyzed using high-resolution high energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of indium obtained using monochromatic Cr K-alpha radiation at 5414.8 eV include survey scan and high-resolution spectra of In 2s, In 2p(3/2), In 3s, In 3p(3/2), In 3d, In 4s, and In 4d.

引用

页数：8