Deep learning-based intelligent measurement methods and system for CMM

被引:3
作者
Cheng, Zhen-Ying [1 ]
Sun, Yuan [1 ]
Hu, Kang [1 ]
Li, Jie [1 ]
Lu, Tien-Fu [2 ]
Li, Rui-Jun [1 ]
机构
[1] Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Hefei 230009, Peoples R China
[2] Univ Adelaide, Sch Mech Engn, Adelaide, SA 5005, Australia
基金
中国国家自然科学基金;
关键词
CMM; Intelligent measurement; Cooperative sensor configuration;
D O I
10.1016/j.measurement.2023.113474
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Extensive manual intervention and management are typically required when using coordinate measuring ma-chines (CMMs) for inspections in production lines leading to low efficiency. This study presents a deep lear-ning-based intelligent measurement method and system for measuring typical features (including holes, cylinders, balls, steps, and slots) of common components to improve inspection efficiency. This method combines vision sensors and a trigger probe. The You Only Look Once algorithm was employed to learn and achieve intelligent detection of features. An image-matching algorithm based on image inverse perspective trans-formation was designed, and the ant colony algorithm was implemented to optimize the measurement sequence. Then, an automatic approach for feature measurement path planning was designed. The presented system was tested using CMM, and a component with multiple typical features was measured. Results show that this method and system can be efficaciously implemented for intelligent measurement of typical features.
引用
收藏
页数:14
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