Hyperspectral imaging of complex dielectric functions in 2D materials

被引:4
作者
Kim, Un Jeong [1 ]
Han, Yoojoong [2 ]
Nugera, Florence A. [3 ]
Yun, Seok Joon [4 ]
Kim, Seok In [2 ]
Lee, Moonsang [5 ]
Gutierrez, Humberto R. [3 ]
Lee, Young Hee [6 ,7 ]
Son, Hyungbin [2 ]
机构
[1] Dongguk Univ, Dept Phys, Seoul 04620, South Korea
[2] Chung Ang Univ, Sch Integrat Engn, Seoul 06974, South Korea
[3] Univ S Florida, Dept Phys, Tampa, FL 33620 USA
[4] Univ Ulsan, Dept Semicond Phys & Engn, Ulsan 44610, South Korea
[5] Inha Univ, Dept Mat Sci & Engn, Incheon 22212, South Korea
[6] Inst Basic Sci IBS, Ctr Integrated Nanostruct Phys CINAP, Suwon 16419, South Korea
[7] Sungkyunkwan Univ SKKU, Dept Energy Sci, Suwon 16419, South Korea
基金
新加坡国家研究基金会;
关键词
Hyperspectral phase microscopy; Spatially -resolved complex dielectric function; Refractive index; Extinction coefficient; Transition metal dichalcogenides; GRAIN-BOUNDARIES; GRAPHENE; GROWTH; MOS2; HETEROSTRUCTURES; STRAIN;
D O I
10.1016/j.nantod.2024.102170
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
It remains a challenge to characterize inhomogeneities in two-dimensional (2D) layered materials associated with strain and defects. Spectroscopic ellipsometry and reflectance/transmittance measurement can be used to characterize complex dielectric functions. However, these techniques are not well suited for submicron spectroscopic imaging of inhomogeneities across a macroscale sample. Here, we report hyperspectral phase microscopy (HPM) to image spatially-resolved complex dielectric functions of refractive index and extinction coefficient of transition metal dichalcogenides. This was implemented by measuring wavelength-dependent phase shifts in optical interference, which were then analyzed by a simple Kramers-Kronig-consistent model. We successfully image not only the phase difference but also patterns of modulated carrier density and strain in mono-/bi-layer heterostructured transition metal dichalcogenides.
引用
收藏
页数:9
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