Visualizing Uncertainty in Machine Learning-Assisted Measurements

被引：0

作者：

Shirmohammadi, Shervin ^{[1
,2
]}

机构：

[1] Univ Ottawa, Sch Elect Engn & Comp Sci, Ottawa, ON, Canada

[2] Discover Lab, Ottawa, ON, Canada

来源：

IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE | 2023年 / 26卷 / 07期

关键词：

D O I：

10.1109/MIM.2023.10238361

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：20 / 27

页数：8

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