ZnO with p-Type Doping: Recent Approaches and Applications

被引:30
作者
Yang, Ruqi [1 ]
Wang, Fengzhi [1 ,2 ]
Lu, Jianguo [1 ,2 ]
Lu, Yangdan [1 ]
Lu, Bojing [1 ]
Li, Siqin [1 ]
Ye, Zhizhen [1 ,2 ]
机构
[1] University, Sch Mat Sci & Engn, State Key Lab Silicon & Adv Semicond Mat, Hangzhou 310027, Zhejiang, Peoples R China
[2] Zhejiang Univ, Inst Wenzhou, Wenzhou Key Lab Novel Optoelect & Nano Mat, Wenzhou 325006, Peoples R China
关键词
ZnO; p-type conduction; doping concentration; acceptor level; self-compensation; LIGHT-EMITTING-DIODES; THIN-FILMS; DUAL IMPLANTATION; FORMATION MECHANISM; OXYGEN VACANCIES; TEMPERATURE; HOMOJUNCTION; FABRICATION; NITROGEN; NANORODS;
D O I
10.1021/acsaelm.3c00515
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
ZnOis a significant semiconductor material with the characteristicsof direct band gap, large exciton binding energy, and easy growthof high-quality nanostructures, and it is widely used in various fields.However, obtaining high-quality p-type ZnO has become a significantobstacle to the wide application of ZnO. The research on p-ZnO startedseveral decades ago and is regarded as the research focus. Many researchershave obtained high-quality p-ZnO by chemical vapor deposition (CVD)and physical vapor deposition (PVD). To obtain high-quality p-ZnO,researchers have used some "better" techniques to improvethe crystal quality and mobility of p-ZnO, such as molecular beamepitaxy (MBE) and post-treatment. This review provides an overviewof some methods for obtaining high-quality p-ZnO, such as increasingthe acceptor concentration, shallowing acceptor energy levels, andreducing donor defects. In addition, we also review the applicationsof p-ZnO in LEDs, UV detectors, thin-film transistors, gas sensing,bionic materials, and other fields.
引用
收藏
页码:4014 / 4034
页数:21
相关论文
共 114 条
[31]   Fabrication of p-Type ZnO: N Films by Oxidizing Zn3N2 Films in Oxygen Plasma at Low Temperature [J].
Jin, Yuping ;
Zhang, Nuannuan ;
Zhang, Bin .
MATERIALS, 2017, 10 (03)
[32]   p-type electrical conduction in ZnO thin films by Ga and N codoping [J].
Joseph, M ;
Tabata, H ;
Kawai, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1999, 38 (11A) :L1205-L1207
[33]   High mobility formation of p-type Al doped ZnO:N films annealed under NH3 ambient [J].
Kalyanaraman, S. ;
Thangavel, R. ;
Vettumperumal, R. .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 2013, 74 (03) :504-508
[34]   Influence of oxygen vacancies on the structural, dielectric, and magnetic properties of (Mn, Co) co-doped ZnO nanostructures [J].
Khan, Rajwali ;
Zulfiqar ;
Levartoski de Araujo, Clodoaldo Irineu ;
Khan, Tahirzeb ;
Muneeb-Ur-Rahman ;
Zia-Ur-Rehman ;
Khan, Aurangzeb ;
Ullah, Burhan ;
Fashu, Simbarashe .
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2018, 29 (12) :9785-9795
[35]   Effect of (O, As) dual implantation on p-type doping of ZnO films [J].
Kim, Chang Oh ;
Shin, Dong Hee ;
Kim, Sung ;
Choi, Suk-Ho ;
Belay, K. ;
Elliman, R. G. .
JOURNAL OF APPLIED PHYSICS, 2011, 110 (10)
[36]   Cu-doped ZnO-based p-n hetero-junction light emitting diode [J].
Kim, J. B. ;
Byun, D. ;
Ie, S. Y. ;
Park, D. H. ;
Choi, W. K. ;
Choi, Ji-Won ;
Angadi, Basavaraj .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2008, 23 (09)
[37]   DEEP ENERGY-LEVELS OF DEFECTS IN THE WURTZITE SEMICONDUCTORS ALN, CDS, CDSE, ZNS, AND ZNO [J].
KOBAYASHI, A ;
SANKEY, OF ;
DOW, JD .
PHYSICAL REVIEW B, 1983, 28 (02) :946-956
[38]   Growth of epitaxial p-type ZnO thin films by codoping of Ga and N [J].
Kumar, Manoj ;
Kim, Tae-Hwan ;
Kim, Sang-Sub ;
Lee, Byung-Teak .
APPLIED PHYSICS LETTERS, 2006, 89 (11)
[39]   Impact of ZnO Cap Layer on the Performance of MgZnO/CdZnO Heterostructure With Y2O3 Spacer Layer [J].
Kumar, Pawan ;
Chaudhary, Sumit ;
Khan, Md Arif ;
Singh, Ruchi ;
Myo Than Htay ;
Prajesh, Rahul ;
Agarwal, Ajay ;
Mukherjee, Shaibal .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2022, 69 (11) :5991-5995
[40]   P-type ZnO thin-film transistors and passivation using photoelectrochemical oxidation method [J].
Lee, Ching-Ting ;
Lin, Yung-Hao .
APPLIED PHYSICS EXPRESS, 2014, 7 (07)