Improvement of Solder Joint Shear Strength under Formic Acid Atmosphere at A Low Temperature

被引:1
作者
He, Siliang [1 ,2 ]
Jiang, Jian [1 ]
Shen, Yu-An [3 ]
Mo, Lanqing [1 ]
Bi, Yuhao [1 ]
Wu, Junke [1 ]
Guo, Chan [2 ]
机构
[1] Guilin Univ Elect Technol, Sch Mech & Elect Engn, Guangxi Educ Dept, Key Lab Microelect Packaging & Assembly Technol, Guilin 541004, Peoples R China
[2] Guangdong Acad Sci, Inst Semicond, Guangzhou 510650, Peoples R China
[3] Feng Chia Univ, Dept Mat Engn & Sci, Taichung 407, Taiwan
基金
中国国家自然科学基金;
关键词
solder joint; fluxless soldering; shear strength; formic acid; Sn-Bi solder; MECHANICAL-PROPERTIES; MICROSTRUCTURE; SN-3.0AG-0.5CU; BEHAVIOR; CU;
D O I
10.3390/ma17051055
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
With the continuous reduction of chip size, fluxless soldering has brought attention to high-density, three-dimensional packaging. Although fluxless soldering technology with formic acid (FA) atmosphere has been presented, few studies have examined the effect of the Pt catalytic, preheating time, and soldering pad on FA soldering for the Sn-58Bi solder. The results have shown that the Pt catalytic can promote oxidation-reduction and the formation of a large pore in the Sn-58Bi/Cu solder joint, which causes a decrease in shear strength. ENIG (electroless nickel immersion gold) improves soldering strength. The shear strength of Sn-58Bi/ENIG increases under the Pt catalytic FA atmosphere process due to the isolation of the Au layer on ENIG. The Au layer protects metal from corrosion and provides a good contact surface for the Sn-58Bi solder. The shear strength of the Sn-58Bi/ENIG joints under a Pt catalytic atmosphere improved by 44.7% compared to using a Cu pad. These findings reveal the improvement of the shear strength of solder joints bonded at low temperatures under the FA atmosphere.
引用
收藏
页数:11
相关论文
共 25 条
  • [1] Flux effect on void quantity and size in soldered joints
    Busek, D.
    Dusek, K.
    Ruzicka, D.
    Placek, M.
    Mach, P.
    Urbanek, J.
    Stary, J.
    [J]. MICROELECTRONICS RELIABILITY, 2016, 60 : 135 - 140
  • [2] Ink-jet printing, self-assembled polyelectrolytes, and electroless plating: Low cost fabrication of circuits on a flexible substrate at room temperature
    Cheng, K
    Yang, MH
    Chiu, WWW
    Huang, CY
    Chang, J
    Ying, TF
    Yang, Y
    [J]. MACROMOLECULAR RAPID COMMUNICATIONS, 2005, 26 (04) : 247 - 264
  • [3] A review of lead-free solders for electronics applications
    Cheng, Shunfeng
    Huang, Chien-Ming
    Pecht, Michael
    [J]. MICROELECTRONICS RELIABILITY, 2017, 75 : 77 - 95
  • [4] Residual free solder process for fluxless solder pastes
    Hanss, Alexander
    Elger, Gordon
    [J]. SOLDERING & SURFACE MOUNT TECHNOLOGY, 2018, 30 (02) : 118 - 128
  • [5] Behavior of Sn-3.0Ag-0.5Cu solder/Cu fluxless soldering via Sn steaming under formic acid atmosphere
    He, Siliang
    Shen, Yu -An
    Xiong, Bifu
    Huo, Fupeng
    Li, Jiahui
    Ge, Jinguo
    Pan, Zhiliang
    Li, Wangyun
    Hu, Chuan
    Nishikawa, Hiroshi
    [J]. JOURNAL OF MATERIALS RESEARCH AND TECHNOLOGY-JMR&T, 2022, 21 : 2352 - 2361
  • [6] He SL, 2017, 2017 INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING (ICEP), P381, DOI 10.23919/ICEP.2017.7939400
  • [7] Ismail N, 2022, RECENT PROGR LEAD FR, P195, DOI 10.1007/978-3-030-93441-5_9
  • [8] Fine-Pitch (≤10 μm) Direct Cu-Cu Interconnects using In-situ Formic Acid Vapor Treatment
    Jangam, SivaChandra
    Bajwa, Adeel
    Mogera, Umesh
    Ambhore, Pranav
    Colosimo, Tom
    Chylak, Bob
    Iyer, Subramanian S.
    [J]. 2019 IEEE 69TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2019, : 620 - 627
  • [9] Low-Temperature Co-hydroxylated Cu/SiO2 Hybrid Bonding Strategy for a Memory-Centric Chip Architecture
    Kang, Qiushi
    Wang, Chenxi
    Zhou, Shicheng
    Li, Ge
    Lu, Tian
    Tian, Yanhong
    He, Peng
    [J]. ACS APPLIED MATERIALS & INTERFACES, 2021, 13 (32) : 38866 - 38876
  • [10] Microstructure and mechanical properties of lead-free solders and solder joints used in microelectronic applications
    Kang, SK
    Lauro, PA
    Shih, DY
    Henderson, DW
    Puttlitz, KJ
    [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 2005, 49 (4-5) : 607 - 620