Two-step retrace error calibration removing tilt ambiguity in coherence scanning interferometry

被引:0
作者
Huang, Lei [1 ]
Wang, Tianyi [1 ]
Austin, Corey [1 ]
Kim, Daewook [2 ]
Idir, Mourad [1 ]
机构
[1] Brookhaven Natl Lab, Natl Synchrotron Light Source 2 NSLS 2, POB 5000, Upton, NY 11973 USA
[2] Univ Arizona, Wyant Coll Opt Sci, Large Opt Fabricat & Testing Grp, 1630 E Univ Blvd, Tucson, AZ 85721 USA
关键词
Calibration; -; Errors;
D O I
10.1364/OL.510943
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In interferometry measurement, the retrace error often limits its high -precision metrology applications. Retrace error calibration with tilted flats can give a relation between the retrace error and the introduced tilt angles, but there is still an ambiguity between the introduced tilt angles and the tilt terms in the created retrace error. We propose a novel, to the best of our knowledge, two-step calibration method to resolve this tilt ambiguity. It involves additional measurements of spherical mirror(s) with known curvature(s). The experiment shows that the curvature deviation due to the tilt ambiguity can be significantly reduced after applying the proposed method. (c) 2024 Optica Publishing Group
引用
收藏
页码:590 / 593
页数:4
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