Growth and characterization of organic 4-hydroxybenzophenone single crystals for nonlinear optical applications

被引:4
作者
Rose, M. L. Lima [1 ,2 ,3 ]
Suthan, T. [4 ]
Gnanasambandam, C. [1 ,2 ]
Girisun, T. C. Sabari [5 ]
Rajesh, N. P. [6 ]
机构
[1] ST Hindu Coll, Dept Phys, Nagercoil 629002, India
[2] ST Hindu Coll, Res Ctr, Nagercoil 629002, India
[3] Malankara Catholic Coll, Dept Phys, Mariagiri 629153, India
[4] Lekshmipuram Coll Arts & Sci, Dept Phys, Neyyoor 629802, India
[5] Bharathidasan Univ, Sch Phys, Nanophoton Lab, Tiruchirappalli 620024, India
[6] Shiv Nadar Univ, Ctr Radiat Environm Sci & Technol, Chennai 603110, Tamil Nadu, India
关键词
LASER DAMAGE THRESHOLD; LIMITING BEHAVIOR; Z-SCAN; POLARIZABILITY;
D O I
10.1007/s10854-023-11078-2
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The organic material 4-hydroxybenzophenone single crystal was grown by slow evaporation solution growth technique. The lattice parameter, space group, and crystal structure of the grown crystal were confirmed using single crystal X-ray diffraction (XRD) studies. The presence of various functional groups were identified using FTIR and FT -Raman spectra studies. The optical properties of the grown crystal were analyzed by using UV-Vis studies. The cut-off wavelength was observed around 357 nm. The dielectric studies of the grown 4-hydroxybenzophenone crystal were analyzed using the parallel plate capacitor method. The electronic properties such as the Plasma energy, Penn gap, Fermi energy, and the electronic polarizability were calculated. The laser damage threshold value of the grown 4-hydroxybenzophenone crystal has been determined using an Nd:YAG laser operating at 532 nm. The nonlinear optical properties of the grown 4-hydroxybenzophenone crystal was analyzed by the Z -scan technique.
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页数:11
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