Markov Model-Based Reliability Analysis Considering the Redundancy Effect of Modular Converters

被引：6

作者：

Jo, Jae-Seong ^{[1
]}

Kim, Sun-Pil ^{[2
]}

Oh, Seok-Gyu ^{[1
]}

Kim, Tae-Jin ^{[3
]}

Kang, Feel-Soon ^{[1
]}

Park, Sung-Jun ^{[4
]}

机构：

[1] Gyeongsang Natl Univ, Dept Mechatron Engn, Jinju 52725, South Korea

[2] G&EPS Co Ltd, Jangseong Gun 57248, Jeollanam Do, South Korea

[3] Korea Electrotechnol Res Inst, Changwon Si 51543, South Korea

[4] Chonnam Natl Univ, Dept Elect Engn, Gwangju 61186, South Korea

来源：

IEEE ACCESS | 2024年 / 12卷

关键词：

Bidirectional DC-DC converters; dual active bridge (DAB); fault tree analysis (FTA); Markov model; mean time between failures (MTBF); redundancy; reliability;

D O I：

10.1109/ACCESS.2023.3348832

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper uses a DAB converter and a non-isolated DC-DC converter as modules. It analyzes the differences in circuit characteristics and reliability due to the redundancy effect by combining them in series and parallel. In particular, reliability is analyzed considering the redundancy effect when the rated power of the DAB converter and non-isolated DC-DC converter are designed to be 50% and 100% of the module-rated power, respectively. The conventional FTA method can analyze failures that reflect the operational risks of modules but cannot analyze partial failures when failures occur in some modules. To solve this problem, this paper predicts the failure rate and MTBF of the converter by modeling state changes and partial failures between modules of a modular converter based on the Markov model. The impact of the redundancy effect on reliability is presented as a quantitative value by calculating the failure rate of major components from the MIL-STD-217F fault library and substituting it into the Markov model.

引用

页码：3328 / 3338

页数：11

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