Analysis of SSD Acoustic Noise Generation Mechanism depending on NAND operation

被引：1

作者：

Cinar, Yusuf ^{[1
]}

Kim, Junghoon ^{[1
]}

Oh, Eunho ^{[1
]}

Lee, Sungki ^{[1
]}

Kwon, Changsik ^{[1
]}

Park, Jonggyu ^{[1
]}

机构：

[1] Samsung Semicond, Solut Prod & Dev Team, Hwaseong Si, South Korea

来源：

2023 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS | 2023年

关键词：

Acoustic; Reliability; SSD;

D O I：

10.1109/IRPS48203.2023.10118247

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This paper investigates the acoustic noise generation mechanism of solid-state drives (SSD) by analyzing NAND operation and measures variation of voltage, vibration, and acoustic pressure depending on the NAND operation. NAND operation is measured with respect to number of overlapped banks during its operation. It is observed that frequency components of bank interleaving process during the NAND operation affect voltage, vibration, and acoustic pressure variation. It was shown that acoustic noise of SSDs greatly depends on NAND operation.

引用

页数：4