共 14 条
[11]
Salas P., 2020, QST MAG MAY, P39
[12]
Wang Q., 2021, P 34 GEN ASS SCI S I, P1, DOI [10.23919/URSIGASS51995.2021.9560402, DOI 10.23919/URSIGASS51995.2021.9560402]
[14]
The "unknown thru" calibration advantage
[J].
ARFTG: AUTOMATIC RF TECHNIQUES GROUP, CONFERENCE DIGEST, SPRING 2004: ON WAFER CHARACTERIZATION,
2004,
:73-81