共 56 条
SDE-based software reliability additive models with masked data using ELS algorithm
被引:0
作者:
Yang, Jianfeng
[1
,3
,4
]
Ding, Ming
[2
,3
,4
]
He, Menglan
[2
,3
,4
]
Zheng, Zhoutao
[2
,3
,4
]
Yang, Nan
[5
]
机构:
[1] Nanning Normal Univ, Sch Math & Stat, Nanning 530100, Peoples R China
[2] Guizhou Univ, Sch Math & Stat, Guiyang 550025, Peoples R China
[3] Guizhou Univ, Guiyang 550025, Peoples R China
[4] Guian Kechuang Supercomp Power Algorithm Lab, Guiyang 550025, Peoples R China
[5] Guizhou Inst Technol, Sch Data Sci, Guiyang 550003, Peoples R China
基金:
中国国家自然科学基金;
关键词:
Software reliability;
Masked data;
Stochastic differential equation;
Expectation least square;
Additive model;
FAULT-DETECTION;
TESTING EFFORT;
GROWTH-MODELS;
NHPP;
D O I:
10.1016/j.jksuci.2024.101978
中图分类号:
TP [自动化技术、计算机技术];
学科分类号:
0812 ;
摘要:
The growing complexity of contemporary software systems, with multiple sub-modules, demands innovative modeling approaches, especially in addressing intricate failures and masked data generation. This paper proposed a stochastic differential equation (SDE)-based software reliability additive model tailored for multicomponent systems dealing with masked data. However, in the presence of masked data, the challenge of parameter estimation arises due to the inherent complexity of the objective function and numerous parameters. To overcome this, we proposed the Expectation Least Square (ELS) algorithm, providing a strategic solution for the intricate task of parameter estimation with masked data. In order to verify the effectiveness of our proposed model, we conducted a comparative analysis with traditional reliability models using three actual failure data sets. The experimental results emphasize the superior performance of the proposed model and highlight the effectiveness of the ELS algorithm in accurately estimating software reliability.
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页数:13
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