Phase formation and electrical properties study of PVDF thick films synthesized by solution casting method

被引：3

作者：

Parida, A. P. Kajal ^{[2
]}

Swain, Sujata ^{[2
]}

Sahu, Rashmirekha ^{[2
]}

Negi, Rashmi Rekha ^{[2
]}

Samanta, Buddhadev ^{[2
]}

Kumar, Pawan ^{[1
,2
]}

机构：

[1] Natl Inst Technol Rourkela, Dept Phys & Astron, Rourkela 769008, India

[2] Natl Inst Technol Rourkela, Dept Phys & Astron, Rourkela, India

来源：

INTERNATIONAL JOURNAL OF MATERIALS RESEARCH | 2023年 / 114卷 / 4-5期

关键词：

Dielectric; Polymer; PVDF; Raman; XRD; POLY(VINYLIDENE FLUORIDE); ENERGY HARVESTER; NANOGENERATOR; COMPOSITES; BEHAVIOR; DENSITY;

D O I：

10.1515/ijmr-2022-0229

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

In this study, polyvinylidene fluoride (PVDF) thick films with thickness similar to 180 mu m were synthesized by solution casting. X-ray diffraction study established the co-existence of both a and beta- phases. Raman spectroscopy of the synthesized PVDF thick films corroborated the existence of a and beta- phases in 0.71:1 ratio. Surface micrographs of PVDF thick films showed dense microstructure with grain size similar to 10 mu m. Additionally, the room temperature values of dielectric constant and dielectric loss at 100 kHz were measured to be similar to 20 and 0.33, respectively. Furthermore, ferroelectric behavior of PVDF thick filmswas confirmed by the polarization versus electric field (P- E) hysteresis loop study. A leakage current density of 1.55 x 10(-5) A cm(-2) at an applied electric field of 500 kV cm(-1) was obtained in PVDF thick films.

引用

页码：344 / 350

页数：7

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