Development of a method for analyzing the positional correlation of local structures in scanning probe microscopy images using template-matching image-processing method

被引：0

作者：

Tsubokura, Sota ^{[1
]}

Kawano, Shoya ^{[2
,3
]}

Imai, Yumiko ^{[4
]}

Ueda, Tadashi ^{[4
]}

Nakamoto, Kei-ichi ^{[4
]}

Noma, Haruo ^{[1
]}

Hioki, Hirohisa ^{[5
]}

Minato, Taketoshi ^{[4
]}

机构：

[1] Ritsumeikan Univ, Dept Informat Sci & Engn, 1-1-1 Noji Higashi, Kusatsu, Shiga 5258577, Japan

[2] Kyushu Inst Technol, Grad Sch Engn, 1-1 Sensui Cho,Tobata Ku, Kitakyushu, Fukuoka 8048550, Japan

[3] Kyushu Inst Technol, Integrated Res Ctr Energy & Environm Adv Technol, 1-1 Sensui Cho,Tobata Ku, Kitakyushu, Fukuoka 8048550, Japan

[4] Inst Mol Sci, Natl Inst Nat Sci, Okazaki, Aichi 4448585, Japan

[5] Kyoto Univ, Grad Sch Human & Environm Studies, Yoshida Nihonmatsu Cho,Sakyo Ku, Kyoto 6068501, Japan

来源：

APPLIED PHYSICS EXPRESS | 2024年 / 17卷 / 03期

关键词：

scanning probe microscopy; atomic force microscopy; scanning tunneling microscopy; surface; interface; image processing; ION BATTERIES; DEFECTS; SURFACE; INTERFACE; ELECTRODE;

D O I：

10.35848/1882-0786/ad2784

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The functionalities of materials are governed by the atom type and arrangement, and perturbations caused by defects and adsorbate interactions often significantly alter the behavior of materials. Scanning probe microscopy (SPM) can capture complex interactions caused by the structures on surfaces. It is, however, difficult to analyze such interactions appearing there. In this paper, an image-processing technique that employs template matching to recognize local structures in SPM images and calculate positional correlations is reported. This approach opens new avenues for investigating intricate perturbations in the sciences and provides detailed insights into materials science.

引用

页数：7

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