High-Spatial-Resolution Strain Sensor Based on Rayleigh-Scattering-Enhanced SMF Using Direct UV Exposure

被引：12
作者：
Du, Chao [1 ,2 ]
Fu, Cailing [1 ,2 ]
Li, Pengfei [1 ,2 ]
Meng, Yanjie [1 ,2 ]
Zhong, Huajian [1 ,2 ]
Du, Bin [1 ,2 ]
Guo, Kuikui [1 ,2 ]
Chen, Lin [1 ,2 ]
Wang, Yiping [1 ,2 ]
He, Jun [1 ,2 ]
机构：
[1] Shenzhen Univ, Coll Phys & Optoelect Engn, Key Lab Optoelect Devices & Syst, Minist Educ & Guangdong Prov, Shenzhen 518060, Peoples R China
[2] Shenzhen Univ, Guangdong & Hong Kong Joint Res Ctr Opt Fiber Sens, Shenzhen Key Lab Photon Devices & Sensing Syst Int, Shenzhen 518060, Peoples R China
来源：
JOURNAL OF LIGHTWAVE TECHNOLOGY | 2023年 / 41卷 / 05期
基金：
中国国家自然科学基金;
关键词：
Optical fiber sensors; Strain; Fiber lasers; Optical fiber polarization; Measurement by laser beam; Spatial resolution; Rayleigh scattering; Distributed strain sensor; optical frequency domain reflectometer; UV exposure; FIBER; BACKSCATTERING; LASER;
D O I：
10.1109/JLT.2022.3224311
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A high-spatial-resolution, i.e., 2.0 mm, strain sensor based on a Rayleigh-scattering-enhanced SMF, i.e., exposed SMF (E-SMF) with direct UV laser, was experimentally demonstrated. The enhancement of Rayleigh-scattering (RS) intensity could be tuned by adjusting the exposure parameters, i.e., distance between SMF and Phase mask, energy of UV laser and velocity of the SMF. A 1.0 m long E-SMF with a RS enhancement of 37.3 dB was obtained, where the exposure time was only 100 s. Compared with the un-exposed SMF (UE-SMF), the strain profiles of the E-SMF could be clearly demodulated without fluctuation at a spatial resolution of 2.0 mm using traditional cross-correlation algorithm when the applied strain was from 200 to 2600 mu e.
引用
收藏
页码：1566 / 1570
页数：5
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