Series resistance errors in whole cell voltage clamp measured directly with dual patch-clamp recordings: not as bad as you think

被引:6
作者
Gray, Michael [1 ]
Santin, Joseph M. [1 ]
机构
[1] Univ Missouri, Div Biol Sci, Columbia, MO 65201 USA
基金
美国国家卫生研究院;
关键词
K plus currents; patch clamp; series resistance; voltage clamp; voltage error; POTASSIUM CURRENTS; CAPACITANCE MEASUREMENTS; FAST TRANSIENT; K+ CURRENTS; HAIR-CELLS; CHANNELS; NEURONS; EXPRESSION; AMPLIFIERS; CALYX;
D O I
10.1152/jn.00476.2022
中图分类号
Q189 [神经科学];
学科分类号
071006 ;
摘要
Whole cell patch clamp has provided much insight into the function of voltage-gated ion channels in central neurons. However, voltage errors caused by the resistance of the recording electrode [series resistance (Rs)] limit its application to relatively small ionic currents. Ohm's law is often applied to estimate and correct the membrane potential for these voltage errors. We tested this assumption in brainstem motoneurons of adult frogs with dual patch-clamp recordings, one performing whole cell voltage clamp of K+ currents and the other directly recording the membrane potential. We hypothesized that Ohm's law-based correc-tion would approximate the measured voltage error. We found that voltage errors averaged <5 mV for currents considered to be large for patch clamp (-7-13 nA) and <10 mV for massive currents thought to be experimentally intractable (25-30 nA), each error falling within commonly accepted inclusion limits. In most cases Ohm's law-based correction overpredicted these measured voltage errors by roughly 2.5-fold. Consequently, the use of Ohm's law to correct for voltage errors led to erroneous current -volt-age (I-V) relationships, showing the greatest distortion for inactivating currents. Finally, recordings with low electrode Rs compen-sated moderately by the amplifier circuitry appeared to have smaller voltage errors than those with larger Rs and high compensation despite the same "effective Rs" and current magnitude. Therefore, when Rs is low, large currents may be studied with better-than-expected voltage control. These results suggest that patch-clamp may be used to study ionic currents often interpreted to be off limits because of size.NEW & NOTEWORTHY Voltage errors occur in whole cell voltage clamp. We make, to our knowledge, the first direct measure-ments of these errors and find that voltage errors are far smaller than standard calculations would predict. Since voltage errors were often minimal during the measurement of large ion channel currents, this technique may be applied to large neurons of adults to gain insight into ion channel function across the life span and progression of disease.
引用
收藏
页码:1177 / 1190
页数:14
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