Kernel Mapping Methods of Convolutional Neural Network in 3D NAND Flash Architecture

被引:2
作者
Song, Min Suk [1 ]
Hwang, Hwiho [1 ]
Lee, Geun Ho [1 ]
Ahn, Suhyeon [1 ]
Hwang, Sungmin [2 ]
Kim, Hyungjin [1 ]
机构
[1] Inha Univ, Dept Elect & Comp Engn, Incheon 22212, South Korea
[2] Korea Univ, Dept AI Semicond Engn, Sejong 30019, South Korea
基金
新加坡国家研究基金会;
关键词
NAND flash memory; 3D NAND architecture; vector-matrix multiplication (VMM); neuromorphic computing; off-chip learning; convolutional neural network (CNN); MEMORY; SYNAPSE; PLASTICITY; MEMRISTOR; DEVICES;
D O I
10.3390/electronics12234796
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
A flash memory is a non-volatile memory that has a large memory window, high cell density, and reliable switching characteristics and can be used as a synaptic device in a neuromorphic system based on 3D NAND flash architecture. We fabricated a TiN/Al2O3/Si3N4/SiO2/Si stack-based Flash memory device with a polysilicon channel. The input/output signals and output values are binarized for accurate vector-matrix multiplication operations in the hardware. In addition, we propose two kernel mapping methods for convolutional neural networks (CNN) in the neuromorphic system. The VMM operations of two mapping schemes are verified through SPICE simulation. Finally, the off-chip learning in the CNN structure is performed using the Modified National Institute of Standards and Technology (MNIST) dataset. We compared the two schemes in terms of various parameters and determined the advantages and disadvantages of each.
引用
收藏
页数:11
相关论文
共 50 条
  • [21] Effect of Lateral Charge Diffusion on Retention Characteristics of 3D NAND Flash Cells
    Yoo, Ho-Nam
    Choi, Bongsik
    Back, Jong-Won
    Kang, Ho-Jung
    Kwon, Eunmee
    Chung, Sungyong
    Bae, Jong-Ho
    Park, Byung-Gook
    Lee, Jong-Ho
    [J]. IEEE ELECTRON DEVICE LETTERS, 2021, 42 (08) : 1148 - 1151
  • [22] ReveNAND: A Fast-Drift-Aware Resilient 3D NAND Flash Design
    Shihab, Mustafa M.
    Zhang, Jie
    Jung, Myoungsoo
    Kandemir, Mahmut
    [J]. ACM TRANSACTIONS ON ARCHITECTURE AND CODE OPTIMIZATION, 2018, 15 (02)
  • [23] Exploiting Asymmetric Errors for LDPC Decoding Optimization on 3D NAND Flash Memory
    Li, Qiao
    Shi, Liang
    Cui, Yufei
    Xue, Chun Jason
    [J]. IEEE TRANSACTIONS ON COMPUTERS, 2020, 69 (04) : 475 - 488
  • [24] Development of a Deep Convolutional Neural Network for the Prediction of Pavement Roughness from 3D Images
    Abohamer, Hossam
    Elseifi, Mostafa
    Dhakal, Nirmal
    Zhang, Zhongjie
    Fillastre, Christophe N.
    [J]. JOURNAL OF TRANSPORTATION ENGINEERING PART B-PAVEMENTS, 2021, 147 (04)
  • [25] Automatic detection of brachytherapy seeds in 3D ultrasound images using a convolutional neural network
    Golshan, Maryam
    Karimi, Davood
    Mahdavi, Sara
    Lobo, Julio
    Peacock, Michael
    Salcudean, Septimiu E.
    Spadinger, Ingrid
    [J]. PHYSICS IN MEDICINE AND BIOLOGY, 2020, 65 (03)
  • [26] Predicting 3D particles shapes based on 2D images by using convolutional neural network
    Giannis, Kostas
    Thon, Christoph
    Yang, Guoqing
    Kwade, Arno
    Schilde, Carsten
    [J]. POWDER TECHNOLOGY, 2024, 432
  • [27] Artificial Neural Network Assisted Error Correction for MLC NAND Flash Memory
    He, Ruiquan
    Hu, Haihua
    Xiong, Chunru
    Han, Guojun
    [J]. MICROMACHINES, 2021, 12 (08)
  • [28] A Novel Structure Between WL Spaces to Improve the Retention Characteristics in 3D NAND Flash
    Suh, Yunejae
    Kyung, Hyewon
    Jung, Youngho
    Kang, Daewoong
    [J]. IEEE ACCESS, 2024, 12 : 15050 - 15055
  • [29] Charge Migration Analysis of 3D SONOS NAND Flash Memory Using Test Pattern
    Jeong, Jun-Kyo
    Sung, Jae-Young
    Yang, Hee-Hoon
    Lee, Hi-Deok
    Lee, Ga-Won
    [J]. JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, 2020, 20 (02) : 151 - 157
  • [30] A memristor-based convolutional neural network with full parallelization architecture
    Sun, Sheng-Yang
    Li, Zhiwei
    Li, Jiwei
    Liu, Husheng
    Liu, Haijun
    Li, Qingjiang
    [J]. IEICE ELECTRONICS EXPRESS, 2019, 16 (03):