Interface engineering by inserting Al2O3 tunneling layer to enhance the performance of graphene/GaAs heterojunction photodetector

被引:14
|
作者
Zhao, Zixuan [1 ]
Zou, Can [1 ]
Zhou, E. [2 ]
Liu, Qing [1 ]
Chen, Kai [1 ]
Wang, Xingfu [1 ]
He, Longfei [3 ]
Gao, Fangliang [1 ]
Li, Shuti [1 ]
机构
[1] South China Normal Univ, Guangdong Engn Res Ctr Optoelect Funct Mat & Devic, Sch Semicond Sci & Technol, Guangzhou 510631, Peoples R China
[2] Jinan Univ, Affiliated Hosp 1, Guangzhou 510632, Peoples R China
[3] Guangdong Acad Sci, Inst Semicond, Guangzhou 510650, Peoples R China
基金
中国国家自然科学基金;
关键词
Interface engineering; Graphene; GaAs heterojunction photodetector; Direct tunneling; Fowler-Nordheim tunneling; SILICON;
D O I
10.1016/j.surfin.2023.102909
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Interface engineering is an effective way to improve the performance of graphene-based photodetectors. Here, a graphene/GaAs heterojunction photodetector is fabricated, and when inserting an Al2O3 tunneling layer, its performance is improved through direct tunneling (DT) and Fowler-Nordheim tunneling (FNT). According to the experimental results, it is found that the thickness of the tunneling layer has a great influence on the performance of the photodetector. Compared with graphene/GaAs photodetector, the performance of graphene/Al2O3(2 nm)/ GaAs photodetector is significantly improved with the responsivity, detectivity, and external quantum efficiency value of 0.80 A/W, 3.02 x 1011 Jones and 306% under 1 mW/cm2 light intensity at 2 V bias. Meanwhile, fast response is also observed (rise/decay time of 3 ms/8.6 ms). The improvement of the photodetector's performance in this work is mainly attributed to the effective modification of the interface state by the Al2O3 tunneling layer and the effect of the two tunneling mechanisms based on DT and FNT.
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页数:9
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