Gearbox fault diagnosis method based on improved semi-supervised MTDL and GAF

被引:1
|
作者
Zhao, Peng [1 ]
Pang, Xinyu [1 ,4 ]
Li, Feng [2 ]
Lu, Kaibo [1 ]
Hu, Shouxin [3 ]
机构
[1] Taiyuan Univ Technol, Sch Mech & Vehicle Engn, Taiyuan, Shanxi, Peoples R China
[2] Taiyuan Univ Technol, Sch Aeronaut & Astronaut, Taiyuan, Peoples R China
[3] CCTEG Taiyuan Res Inst Co Ltd, Taiyuan, Peoples R China
[4] Taiyuan Univ Technol, Coll Mech & Vehicle Engn, Taiyuan 030024, Shanxi, Peoples R China
基金
中国国家自然科学基金;
关键词
GAF image encoding; gearbox fault diagnosis; semi-supervised; deep learning; WideResNet; CLASSIFICATION; TRANSFORM; MATRIX;
D O I
10.1177/00202940241230488
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Aiming at the problem that it takes a long time and high cost to obtain complete labeled data under intelligent fault diagnosis and unlabeled data is not used. This paper proposes an improved semi-supervised mean teacher deep learning (MTDL) and Gramian angle field (GAF) fusion diagnostic method. This method fully utilizes a small number of labeled samples and a large number of unlabeled samples to deeply mine invisible fault features and potential physical correlations. At the same time, it solves the problem of losing the inter-data correlation structure when one-dimensional time series signals are used as inputs for neural networks. The GAF-MTDL method uses consistency regularization and modifies the network structure in the mean teacher algorithm into a semi-supervised deep learning model enhanced by WideResNet. The experimental results show that the proposed GAF-MTDL method saves a lot of manual labeling costs, improves the recognition accuracy and generalization ability, and can achieve excellent prediction accuracy with very little labeled data. In the end, the accuracy of planetary gear fault identification reached 98.22% under the labeling rate of 20%, and the accuracy of fault identification reached 99.98% through the verification of the bearing data set of Case Western Reserve University. The value of this research is to bring an efficient and low-cost technology to the field of industrial intelligent fault diagnosis, which can significantly improve the accuracy of fault identification.
引用
收藏
页码:1181 / 1193
页数:13
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