constant fraction discriminator;
time walk;
time of flight;
single event upset;
watchdog;
integrated circuit;
D O I:
10.1109/SENSORS56945.2023.10324976
中图分类号:
R318 [生物医学工程];
学科分类号:
0831 ;
摘要:
Electrostatic analyzers like the Solar Probe Analyzer for Ions can use time-of-flight techniques to determine the ion composition of space plasmas. The conversion of trigger events to their digital equivalent is a central component of any timing-based front end, with integrated solutions increasingly desirable for constrained size, weight, and power budgets. Conventional analog methods of pulse discrimination introduce timing walk or are limited to a narrow set of pulse shapes, while digital methods require impractically high sample rates for the allowable power consumption. This work presents an integrated constant fraction discriminator with theoretically zero timing walk and a well-defined and programmable trigger fraction that does not depend on input pulse shape. The test chip was fabricated in 0.18 mu m bulk CMOS with 3 mA of current drawn from an internally regulated 1.8 V supply, and a measured timing walk of 601 ps over a 10x change in input pulse amplitude with a worst case jitter of 743 ps.
机构:
Univ Strasbourg, UMR 7357, ICube, F-67037 Strasbourg, France
CNRS, F-67037 Strasbourg, France
Optronis GmbH, D-77694 Kehl, GermanyUniv Strasbourg, UMR 7357, ICube, F-67037 Strasbourg, France
Wlotzko, Vincent
论文数: 引用数:
h-index:
机构:
Uhring, Wilfried
Summ, Patrick
论文数: 0引用数: 0
h-index: 0
机构:
Optronis GmbH, D-77694 Kehl, GermanyUniv Strasbourg, UMR 7357, ICube, F-67037 Strasbourg, France
Summ, Patrick
2014 IEEE 12TH INTERNATIONAL NEW CIRCUITS AND SYSTEMS CONFERENCE (NEWCAS),
2014,
: 245
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248