A low noise CMOS camera system for 2D resonant inelastic soft X-ray scattering

被引:1
|
作者
Andresen, Nord [1 ]
Bakalis, Christos [1 ]
Denes, Peter [1 ]
Goldschmidt, Azriel [1 ]
Johnson, Ian [1 ]
Joseph, John M. [1 ]
Karcher, Armin [1 ]
Krieger, Amanda [1 ]
Tindall, Craig [1 ]
机构
[1] Lawrence Berkeley Natl Lab, Engn Div, Berkeley, CA 94720 USA
关键词
RIXS; x-ray; CMOS sensor; spectrometer; back-illumination; low noise; synchrotron; light source;
D O I
10.3389/fphy.2023.1285379
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Resonant Inelastic X-ray Scattering (RIXS) is a powerful spectroscopic technique to study quantum properties of materials in the bulk. A novel variant of RIXS, called 2D RIXS, enables concurrent measurement of the scattered X-ray spectrum for a wide range of input energies, improving on the typically low throughput of 1D RIXS. In the soft X-ray domain, 2D RIXS demands an X-ray camera system with small pixels, large area, high quantum efficiency and low noise to limit the false detection rate in long duration exposures. We designed and implemented a 7.5 Megapixel back-illuminated CMOS detector with 5 mu m pixels and high quantum efficiency in the 200-1,000 eV X-ray energy range for the QERLIN 2D RIXS spectrometer at the Advanced Light Source. The QERLIN beamline and detector are currently in commissioning. The camera noise from in-situ 3 s long dark exposures is 7e- or less and the leakage current is 6.5 x 10-3 e-/(pixel center dot s). For individual 500 eV X-rays, the expected efficiency is greater than 75% and the false detection rate is similar to 1 x 10-5 per pixel.
引用
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页数:11
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