Near-field multi-slice ptychography: quantitative phase imaging of optically thick samples with visible light and X-rays

被引:6
|
作者
Hu, Ziyang [1 ]
Zhang, Yiqian [1 ]
LI, Peng [2 ]
Batey, Darren [2 ]
Maiden, Andrew [1 ,2 ]
机构
[1] Univ Sheffield, Dept Elect & Elect Engn, Sheffield S1 3JD, England
[2] Harwell Sci & Innovat Campus, Diamond Light Source, Fermi Ave, Didcot OX11 0DE, England
关键词
Compilation and indexing terms; Copyright 2025 Elsevier Inc;
D O I
10.1364/OE.487002
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Ptychography is a form of lens-free coherent diffractive imaging now used extensively in electron and synchrotron-based X-ray microscopy. In its near-field implementation, it offers a route to quantitative phase imaging at an accuracy and resolution competitive with holography, with the added advantages of extended field of view and blind deconvolution of the illumination beam profile from the sample image. In this paper we show how near-field ptychography can be combined with a multi-slice model, adding to this list of advantages the unique ability to recover high-resolution phase images of larger samples, whose thickness places them beyond the depth of field of alternative methods.
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收藏
页码:15791 / 15809
页数:19
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