Causality analysis;
Interpretable machine learning;
Process mining;
Petri nets;
Discrete event systems;
Supervisory control;
ROOT CAUSE DIAGNOSIS;
FAULT-DIAGNOSIS;
CHEMICAL-PROCESSES;
GRANGER CAUSALITY;
PROCESS MODELS;
SIGNED DIGRAPHS;
TREE ANALYSIS;
PETRI NETS;
GRAPH;
MAP;
D O I:
10.1007/s10845-021-01903-y
中图分类号:
TP18 [人工智能理论];
学科分类号:
081104 ;
0812 ;
0835 ;
1405 ;
摘要:
The complexity of industrial processes imposes a lot of challenges in building accurate and representative causal models for abnormal events diagnosis, control and maintenance of equipment and process units. This paper presents an innovative data-driven causality modeling approach using interpretable machine learning and process mining techniques, in addition to human expertise, to efficiently and automatically capture the complex dynamics of industrial systems. The approach tackles a significant challenge in the causality analysis community, which is the discovery of high-level causal models from low-level continuous observations. It is based on the exploitation of event data logs by analyzing the dependency relationships between events to generate accurate multi-level models that can take the form of various state-event diagrams. Highly accurate and trustworthy patterns are extracted from the original data using interpretable machine learning integrated with a model enhancement technique to construct event data logs. Afterward, the causal model is generated from the event log using the inductive miner technique, which is one of the most powerful process mining techniques. The causal model generated is a Petri net model, which is used to infer causality between important events as well as a visualization tool for real-time tracking of the system's dynamics. The proposed causality modeling approach has been successfully tested based on a real industrial dataset acquired from complex equipment in a Kraft pulp mill located in eastern Canada. The generated causality model was validated by ensuring high model fitness scores, in addition to the process expert's validation of the results.
机构:
Tech Univ Korea, Dept IT Semicond Convergence Engn, Shihung Si, South KoreaTech Univ Korea, Dept IT Semicond Convergence Engn, Shihung Si, South Korea
Islam, Md. Saiful
Kim, Kihyun
论文数: 0引用数: 0
h-index: 0
机构:
Tech Univ Korea, Dept Mechatron Engn, Siheung Si, South KoreaTech Univ Korea, Dept IT Semicond Convergence Engn, Shihung Si, South Korea
Kim, Kihyun
Kim, Hyo-Young
论文数: 0引用数: 0
h-index: 0
机构:
Tech Univ Korea, Dept Mechatron Engn, Siheung Si, South KoreaTech Univ Korea, Dept IT Semicond Convergence Engn, Shihung Si, South Korea
机构:
Duy Tan Univ, Inst Res & Dev, Da Nang 550000, Vietnam
Duy Tan Univ, Fac Civil Engn, Da Nang 550000, VietnamDuy Tan Univ, Inst Res & Dev, Da Nang 550000, Vietnam
Hoang, Nhat-Duc
Tran, Van-Duc
论文数: 0引用数: 0
h-index: 0
机构:
Duy Tan Univ, Fac Civil Engn, Da Nang 550000, Vietnam
Duy Tan Univ, Int Sch, Da Nang 550000, VietnamDuy Tan Univ, Inst Res & Dev, Da Nang 550000, Vietnam
Tran, Van-Duc
Huynh, Thanh-Canh
论文数: 0引用数: 0
h-index: 0
机构:
Duy Tan Univ, Inst Res & Dev, Da Nang 550000, Vietnam
Duy Tan Univ, Fac Civil Engn, Da Nang 550000, VietnamDuy Tan Univ, Inst Res & Dev, Da Nang 550000, Vietnam