Mapping AC susceptibility with quantum diamond microscope

被引:4
作者
Dasika, Shishir [1 ]
Parashar, Madhur [1 ]
Saha, Kasturi [1 ]
机构
[1] Indian Inst Technol, Dept Elect Engn, Mumbai 400076, India
关键词
MAGNETIC-SUSCEPTIBILITY; SUPERCONDUCTIVITY; DEFECTS;
D O I
10.1063/5.0138301
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We present a technique for determining the micro-scale AC susceptibility of magnetic materials. We use the magnetic field sensing properties of nitrogen-vacancy (NV-) centers in diamond to gather quantitative data about the magnetic state of the magnetic material under investigation. A quantum diamond microscope with an integrated lock-in camera is used to perform pixel-by-pixel, lock-in detection of NV- photo-luminescence for high-speed magnetic field imaging. In addition, a secondary sensor is employed to isolate the effect of the excitation field from fields arising from magnetic structures on NV- centers. We demonstrate our experimental technique by measuring the AC susceptibility of soft permalloy micro-magnets at excitation frequencies of up to 20 Hz with a spatial resolution of 1.2 mu m and a field of view of 100 mu m. Our work paves the way for microscopic measurement of AC susceptibilities of magnetic materials relevant to physical, biological, and material sciences. Published under an exclusive license by AIP Publishing.
引用
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页数:9
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