Fourier Ptychography Microscopy Based on Super-Resolution Adversarial Network

被引:1
作者
Wang Yi [1 ,2 ]
Wei Xiaoyu [1 ]
Liu Baohui [1 ]
Su Hao [1 ,3 ]
机构
[1] North China Univ Sci & Technol, Coll Elect Engn, Tangshan 063210, Hebei, Peoples R China
[2] Tangshan Technol Innovat Ctr Intellectualisat Met, Tangshan 063210, Hebei, Peoples R China
[3] Tangshan Key Lab Semicond Integrated Circuits, Tangshan 063210, Hebei, Peoples R China
关键词
microscopy; computational imaging; Fourier ptychography microscopy; generative adversarial network; superresolution; reconstruction; deep learning; HIGH-RESOLUTION; WIDE-FIELD; PHASE RETRIEVAL; RECONSTRUCTION;
D O I
10.3788/LOP222900
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Fourier ptychography microscopy ( FPM) is limited by hardware and algorithm, and its overall performance needs to be improved. To address the issues of slow imaging speed and low imaging quality of traditional FPM technology, the FPM image reconstruction approach integrated with depth learning has been widely explored. Herein, based on this, a super-resolution countermeasure generation network-based FPM model is proposed. Furthermore, global feature fusion is obtained by adding dense block connections using the original network, and a weighted loss function is used to enhance the quality of image reconstruction. The reconstruction results of the resolution plate image demonstrate that the proposed depth learning method has a better reconstruction effect and faster reconstruction speed than the conventional method.
引用
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页数:7
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