The influence of aperture on the imaging quality of microfocus x-ray source

被引:1
|
作者
Dong, Zengya [1 ]
Shi, Lina [1 ,2 ]
Niu, Geng [1 ]
Wang, Wenbo [1 ]
Liu, Junbiao [1 ,2 ]
Han, Li [1 ]
机构
[1] Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R China
[2] Univ Chinese Acad Sci, Dept Elect Elect & Commun Engn, Beijing, Peoples R China
关键词
aperture; electron optics; imaging quality; microfocus x-ray source;
D O I
10.1002/xrs.3349
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
Electron beam (e-beam) with a small spot size is the key to produce microfocus x-ray source. The spot size of the e-beam can be controlled by changing the aperture angle at the target, and the focus size of the microfocus x-ray source is changed accordingly. At the same time, the SNR (Signal-to-Noise Ratio) of the image is reduced because the aperture produces secondary x-ray, which interferes with the x-ray imaging. In this paper, the aperture size and its position are optimized for getting the smallest spot size of the e-beam, and the experimental results show that the resolution is 0.8 mu m with the aperture size of 0.5 mm. In addition, this paper also presents that the image's SNR can be improved by coating carbon film on the back surface of the aperture.
引用
收藏
页码:242 / 248
页数:7
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