Characterization of Electromechanical Delamination Behaviors in Practical REBCO Coated Conductor Tapes Under Transverse Tension at 77 K

被引:5
|
作者
Diaz, Mark Angelo [1 ]
Shin, Hyung-Seop [1 ]
机构
[1] Andong Natl Univ, Dept Mech Design Engn, Andong 36729, South Korea
基金
新加坡国家研究基金会;
关键词
Delamination; Current measurement; Behavioral sciences; Degradation; Conductors; Time measurement; Testing; Anvil test; coated conductor; delamination mechanism; electromechanical delamination strength; transverse tension; STRENGTH; COIL;
D O I
10.1109/TASC.2023.3242213
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In high-temperature superconducting coils, the high transport current density and magnetic field generate a large electromagnetic force on REBCO-coated conductor (CC) tapes. A large Lorentz force can cause interlayer delamination damage to the CC tape under radial or transverse tensile loads. The structural delamination characteristics of multilayered REBCO CC tape are essential for the fabrication of mechanically reliable CC coils. In this study, the electromechanical delamination behaviors of practical REBCO CC tapes were characterized using an anvil test method. Our recently established continuous critical current, I-c measurement system was used to minimize the test time and can directly evaluate the effect of the transverse tensile load on I-c behavior without time-consuming intermittent I-c measurements during testing. Characterization of the delamination mechanism, including damage initiation, was performed through scanning electron microscopy observation of the fractured sample. Two-parameter Weibull distribution analysis was used to specify the data scattering of the electromechanical delamination strength.
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页数:5
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