Parametric control chart;
statistical process control;
sequential probability ratio test;
Markov chain;
D O I:
10.1080/00949655.2023.2296928
中图分类号:
TP39 [计算机的应用];
学科分类号:
081203 ;
0835 ;
摘要:
A two-sided sequential probability ratio test (SPRT) control chart for monitoring the mean of a normal process is proposed in this paper. Its mechanism is based on the SPRT for the mean of a normal distribution that is extended for a two-sided alternative. The exact statistical performance measures of this chart are obtained using a Markov chain approach. An approach to design the chart such that it has a specified in-control performance and the optimal out-of-control performance for detecting a mean shift of a particular size is provided. The statistical performance of this chart is numerically compared with that of various competing charts in the existing literature. It is found that the proposed chart outperforms all these charts for detecting a mean shift of any size. An example to illustrate the mechanism of the chart is provided.
机构:
Pukyong Natl Univ, Dept Syst Management & Engn, Pusan 608739, South KoreaPukyong Natl Univ, Dept Syst Management & Engn, Pusan 608739, South Korea
Kwon, Hyuck Moo
Hong, Sung Hoon
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机构:
Chonbuk Natl Univ, Res Ctr Ind Technol, Dept Ind & Informat Syst Engn, Chonju 561756, Chonbuk, South KoreaPukyong Natl Univ, Dept Syst Management & Engn, Pusan 608739, South Korea
Hong, Sung Hoon
Lee, Min Koo
论文数: 0引用数: 0
h-index: 0
机构:
Chungnam Natl Univ, Dept Informat & Stat, Taejon 305764, South KoreaPukyong Natl Univ, Dept Syst Management & Engn, Pusan 608739, South Korea
Lee, Min Koo
INTERNATIONAL JOURNAL OF INDUSTRIAL ENGINEERING-THEORY APPLICATIONS AND PRACTICE,
2007,
14
(04):
: 348
-
354