共 35 条
Domain Invariant Feature Learning Based on Cluster Contrastive Learning for Intelligence Fault Diagnosis With Limited Labeled Data
被引:4
作者:
Wei, Yang
[1
,2
]
Wang, Kai
[1
,2
]
机构:
[1] Sichuan Univ, Sch Mech Engn, Chengdu 610065, Peoples R China
[2] Sichuan Univ, Innovat Method & Creat Design Key Lab Sichuan Prov, Chengdu 610065, Peoples R China
关键词:
Intelligence fault diagnosis;
self-supervised learning;
clustering;
DATA AUGMENTATION;
D O I:
10.1109/LSP.2023.3336564
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
In real industrial scenarios, the limited available labeled fault data and existed significant data distribution differences between the source domain and the target domain emplace challenges and obstacles for cross-domain fault diagnosis. In this letter, we proposed a novel cluster contrastive learning method (CLCO) for few-shot learning (even one-shot learning) and cross-domain fault diagnosis under complex fault modes, fault severities, and variable working conditions. The proposed CLCO combines clustering strategy and contrastive learning to learn discriminate domain invariant feature representation. Moreover, the consistency in the characteristic distribution of data is viewed as the pseudo label information captured by k-means clustering, which are subsequently embedded into strengthen contrastive loss (SCL) function of proposed CLCO model. Then, the pseudo label information is exploited to guide self-supervised contrastive pre-training for learning domain invariant features based on feature similarity comparison of positive and negative pairs. Extensive experimental results demonstrate that our proposed CLCO outperforms existing state-of-the-art methods by a large margin.
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页码:1787 / 1791
页数:5
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