共 67 条
[33]
Kumar R. Praveen, 2020, Journal of Physics: Conference Series, V1716, DOI 10.1088/1742-6596/1716/1/012023
[40]
Automatic Defect Recognition in X-ray Testing using Computer Vision
[J].
2017 IEEE WINTER CONFERENCE ON APPLICATIONS OF COMPUTER VISION (WACV 2017),
2017,
:1026-1035